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| Presentation | 2013-12-13 17:20 Characterization of interface states in SiC MOS structures with various crystal faces by conductance method Seiya Nakazawa, Yuichiro Nanen, Jun Suda, Tsunenobu Kimoto (Kyoto Univ.) |
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| PDF Download Link |  SDM2013-133 Link to ES Tech. Rep. Archives: SDM2013-133 |
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