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| Presentation | 2013-02-27 14:10 Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./Research Fellow of JSPS) |
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| PDF Download Link |  ED2012-129 SDM2012-158 Link to ES Tech. Rep. Archives: ED2012-129 SDM2012-158 |
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