IEICE Technical Committee Submission System
Download Link
Online Proceedings
[Sign in]
Tech. Rep. Archives
Go Top Page
Go Previous
[Japanese]
/
[English]
PDF Download Link
Presentation
2005-09-21 10:00
Recognition Method of Minute Defect Based on Comparison to Statistical Pattern and Outlier Detection on Feature Space
Kaoru Sakai
,
Shunji Maeda
(
Hitachi
)
PDF Download Link
Please login to
the IEICE Technical Committee Online System (in Japanese)
.
[Return to Top Page]
[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan