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Presentation |
2011-11-17 12:55
Realization of Freestanding GaN Substrates with High Surface Quality and Low Dislocation Density by Crystal Hardness Control Hajime Fujikura, Yuichi Oshima, Takehiro Yoshida, Takeshi Megro, Toshiya Saito (Hitachi Cable) |
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ED2011-77 CPM2011-126 LQE2011-100 Link to ES Tech. Rep. Archives: ED2011-77 CPM2011-126 LQE2011-100 |
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