PDF Download Link |
Presentation |
2011-05-26 10:20
Measurement of Electromagnetic Field Intensity Measurement near Circuit Bord using Infrared 2-D Lock-in Amplifier Noritaka Chiyo, Yuji Komine, Yasuhiro Tanaka (Tokyo City Univ.), Atsuhiro Nishikata, Takuichi Hirano (Tokyo Tech), Takashi Maeno (NICT) |
PDF Download Link |
EMCJ2011-11 MW2011-8 EST2011-4 Link to ES Tech. Rep. Archives: MW2011-8 EST2011-4 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
|