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| Presentation | 2011-01-28 16:05 Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) -- Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) |
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| PDF Download Link |  EMD2010-142 Link to ES Tech. Rep. Archives: EMD2010-142 |
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