| IEICE Technical Committee Submission System Download Link |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| PDF Download Link | ||
| Presentation | 2009-06-05 14:50 Study for extracting the characteristics of LSI power supply at high frequency including the parasitic coupling between package and chip Tomohiro Kita, Yuichi Mabuchi, Hiroshi Tanaka, Takashi Hisakado, Osami Wada (Kyoto Univ.), Atsushi Nakamura (Renesas Tech.) |
|
| PDF Download Link |  EMCJ2009-31 |
|
| Copyright and reproduction | All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
[Return to Top Page]