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| Presentation | 2005-01-28 09:30 High reliability assurance method and its apprication on high density and large pin-count package Syuhei Hashimoto, Yassumasa Kawaguchi, Minoru Hanyu, Toshihiro Matsunaga, Mitsuhisa Matsuo, Naoko Kawatani, Yasuhisa Higuchi, Takahiko Takahashi (Hitachi,LTD MDD) |
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| PDF Download Link | Link to ES Tech. Rep. Archives:  CPM2004-163 ICD2004-208 |
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