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| Presentation | 2008-07-17 09:00 Impact of the Different Nature of Interface Defect States on the NBTI and 1/f noise of High-k / Metal Gate pMOSFETs between (100) and (110) Crystal Orientations Motoyuki Sato, Yoshihiro Sugita, Takayuki Aoyama, Yasuo Nara, Yuzuru Ohji (Selete) |
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| PDF Download Link |  SDM2008-128 ICD2008-38 Link to ES Tech. Rep. Archives: SDM2008-128 ICD2008-38 |
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