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Presentation |
2008-05-16 13:30
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism
-- Basal characteristics of 3-D oscillating mechanism -- Shin-ichi Wada, Hiroshi Amao, Keiji Koshida, Taketo Sonoda, Hiroto Minegishi, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio) |
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EMD2008-5 Link to ES Tech. Rep. Archives: EMD2008-5 |
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