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| Presentation | 2008-01-30 14:20 Dopant ionization in silicon nanodevices investigated by Kelvin Probe Force Microscope Maciej Ligowski (Shizuoka Univ./Warsaw Univ. of Tech.), Ratno Nuryadi, Akihiro Ichiraku, Miftahul Anwar (Shizuoka Univ.), Ryszard Jablonski (Warsaw Univ. of Tech.), Michiharu Tabe (Shizuoka Univ.) |
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| PDF Download Link |  ED2007-239 SDM2007-250 Link to ES Tech. Rep. Archives: ED2007-239 SDM2007-250 |
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