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| Presentation | 2007-01-19 15:15 Current collapse of inslated-gate GaN-HEMT Masahito Kanamura, Toshihiro Ohki, Kenji Imanishi, Kozo Makiyama, Naoya Okamoto (Fujitsu, Fujitsu Labs.), Naoki Hara (Fujitsu Labs.), Toshihide Kikkawa, Kazukiyo Joshin (Fujitsu, Fujitsu Labs.) |
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| PDF Download Link | Link to ES Tech. Rep. Archives:  ED2006-236 MW2006-189 |
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