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2023-12-01 14:00
High thickness controllability of AlInN/GaN DBRs with in-situ reflectivity spectra measurements Kenta Kobayashi, Ruka Watanabe, Taichi Nishikawa, Tetsuya Takeuchi, Motoaki Iwaya, Satoshi Kamiyama (Meijo Univ.) |
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ED2023-31 CPM2023-73 LQE2023-71 |
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