| IEICE Technical Committee Submission System Download Link |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| PDF Download Link | ||
| Presentation | 2023-02-28 16:15 A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU) |
|
| PDF Download Link |  DC2022-91 |
|
| Copyright and reproduction | All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
[Return to Top Page]