| IEICE Technical Committee Submission System Download Link |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| PDF Download Link | ||
| Presentation | 2022-11-17 10:00 Generalization capability improvement of fine-defect discrimination on dielectric surface using optical linear discrimination analysis filter with error detection Shingo Shimada, Jun-ichiro Sugisaka, Koichi Hirayama, Takashi Yasui (Kitami Inst. Tech.) |
|
| PDF Download Link |  EMT2022-53 |
|
| Copyright and reproduction | All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
[Return to Top Page]