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Presentation |
2006-11-24 15:40
Surface passivation film dependence of 1/f noise characteristic in AlGaN/GaN HEMT Takanori Matsushima, Masahiro Nakajima, Kazuki Nomoto, Masataka Satoh, Tohru Nakamura (Hosei Univ.) |
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Link to ES Tech. Rep. Archives: ED2006-181 SDM2006-199 |
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