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2021-10-07 10:05
VNA calibration stability in on-wafer measurement in millimeter-wave band Kohei Fujiwara, Takashi Kondo (TIRI), Shinji Hara, Noriyuki Tanba, Eiji Suematsu (Nagoya University) |
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EMCJ2021-28 MW2021-40 EST2021-30 Link to ES Tech. Rep. Archives: MW2021-40 EST2021-30 |
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