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| Presentation | 2020-11-26 14:10 Mapping of Photoelectrochemical Etched Ni/GaN Schottky Contacts Using Scanning Internal Photoemission Microscopy -- Comparison between n- and p-type GaN samples -- Ryo Matsuda (Univ. of Fukui), Fumimasa Horikiri, Yoshinobu Narita, Takehiro Yoshida, Noboru Fukuhara (SCIOCS), Tomoyoshi Mishima (Hosei Univ.), Kenji Shiojima (Univ. of Fukui) |
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| PDF Download Link |  ED2020-9 CPM2020-30 LQE2020-60 Link to ES Tech. Rep. Archives: ED2020-9 CPM2020-30 LQE2020-60 |
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