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2020-12-02 11:40
Evaluation of dielectric properties of ferroelectric thin films for neural networks Yuma Ishisaki, Hiroki Umemura, Daiki Matsukawa, Mutsumi Kimura (RU), Eisuke Tokumitsu (JAIST), Kenichi Haga, Toshihiro Doi (MMC) |
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EID2020-5 SDM2020-39 Link to ES Tech. Rep. Archives: EID2020-5 SDM2020-39 |
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