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2020-11-17 11:20
Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) |
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VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 Link to ES Tech. Rep. Archives: ICD2020-35 |
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