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| Presentation | 2006-08-18 09:00 A Test Structure to Separately Analyze CMOSFET Reliabilities along The Channel Width Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Toshihiro Matsuda, Hideyuki Iwata (Toyama Pref. Univ.) |
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| PDF Download Link | Link to ES Tech. Rep. Archives:  SDM2006-142 ICD2006-96 |
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