Information and Systems-Image Engineering(Date:2021/10/21)

Presentation
Highly sensitive TMR sensor and its application to bio-magnetic field measurement

Mikihiko Oogane(Tohoku Univ.),  

[Date]2021-10-21
[Paper #]SDM2021-50
Characterization of Gallium Oxide Thin Film Deposited by Sputtering Method

Fuminobu Imaizumi(NIT, Oyama college),  

[Date]2021-10-21
[Paper #]SDM2021-45
[Invited Talk] Device and Integration Technologies Realizing Silicon Quantum Computers

Takahiro Mori(AIST),  

[Date]2021-10-21
[Paper #]SDM2021-49
A study on Hf-based MONOS nonvolatile memory with HfO2 and HfON tunneling layers for multi-bit/cell operation

Pyo Jooyoung(Tokyo Tech.),  Ihara Akio(Tokyo Tech.),  Ohmi Shun-ichiro(Tokyo Tech.),  

[Date]2021-10-21
[Paper #]SDM2021-48
A study on Ar/N2-plasma sputtering gas pressure dependence on the LaBxNy insulator formation for non-volatile memory applications

Eun-Ki Hong(Tokyo Tech.),  Shun-ichiro Ohmi(Tokyo Tech.),  

[Date]2021-10-21
[Paper #]SDM2021-46
[Invited Talk] Influence of Fluorine on Reliabilities of SiO2 and SixNy Films

Yuichiro Mitani(Tokyo City Univ.),  

[Date]2021-10-21
[Paper #]SDM2021-44
Current Measurement Platform Applied for Statistical Measurement of Discharge Current due to Traps in SiN Dielectrics

Koga Saito(Tohoku Univ.),  Hayato Suzuki(Tohoku Univ.),  Hyeonwoo Park(Tohoku Univ.),  Rihito Kuroda(Tohoku Univ.),  Akinobu Teramoto(Hiroshima Univ.),  Tomoyuki Suwa(Tohoku Univ.),  Shigetoshi Sugawa(Tohoku Univ.),  

[Date]2021-10-21
[Paper #]SDM2021-51
Statistical analysis of RTN behavior on transistor structure, operating region, and carrier transport direction

Ryo Akimoto(Tohoku Univ.),  Rihito Kuroda(Tohoku Univ.),  Takezo Mawaki(Tohoku Univ.),  Shigotoshi Sugawa(Tohoku Univ.),  

[Date]2021-10-21
[Paper #]SDM2021-52
A study on the effect of inter layers on ferroelectric nondoped HfO2 formation

Masakazu Tanuma(Tokyo Tech.),  Joong-Won Shin(Tokyo Tech.),  Shun-ichiro Ohmi(Tokyo Tech.),  

[Date]2021-10-21
[Paper #]SDM2021-47