Information and Systems-Image Engineering(Date:2019/02/27)

Presentation
A Compaction Method for Test Sensitization State in Controllers

Yuki Ikegaya(Nihon Univ.),  Yuta Ishiyama(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  Hiroshi Yamazaki(Nihon Univ.),  

[Date]2019-02-27
[Paper #]DC2018-80
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors

Kenichiro Misawa(Nihon Univ),  Toshinori Hosokawa(Nihon Univ),  Hiroshi Yamazaki(Nihon Univ),  Masayoshi Yoshimura(Kyouto Sangyo Univ),  

[Date]2019-02-27
[Paper #]DC2018-73
Improvement of Flip-Flop Performance Considering the Influence of Power Supply Noise

Yuya Kinoshita(Tokyo Metropolitan Univ.),  Yukiya Miura(Tokyo Metropolitan Univ.),  

[Date]2019-02-27
[Paper #]DC2018-82
State Assignment Method to Improve Transition Fault Coverage for Datapath

Masayoshi Yoshimura(Kyoto Sangyo Univ.),  Yuki Takeuchi(Nihon Univ.),  Hiroshi Yamazaki(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  

[Date]2019-02-27
[Paper #]DC2018-78
An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling

Foisal Ahmed(NAIST),  Michihiro Shintani(NAIST),  Michiko Inoue(NAIST),  

[Date]2019-02-27
[Paper #]DC2018-77
Variational Autoencoder-Based Efficient Test Escape Detection

Michihiro Shintani(NAIST),  Kouichi Kumaki(Renesas Electronics Corporation),  Michiko Inoue(NAIST),  

[Date]2019-02-27
[Paper #]DC2018-72
A built-in self-diagnosis mechanism based on self-generation of expected signatures

Yushiro Hiramoto(Oita Univ.),  Satoshi Ohtake(Oita Univ.),  Hiroshi Takahashi(Ehime Univ.),  

[Date]2019-02-27
[Paper #]DC2018-76
連続時間マルコフ連鎖による遅延耐性ネットワークの一評価手法

Ryota Mizuhara(Tokyo Metropolitan Univ.),  Kazuya Sakai(Tokyo Metropolitan Univ.),  Satoshi Fukumoto(Tokyo Metropolitan Univ.),  

[Date]2019-02-27
[Paper #]DC2018-83
Note on Target Fault Selection for 2-Pattern Test Generation Considering Critical Area

Naoya Uchiyama(Nihon Univ.),  Masayuki Arai(Nihon Univ.),  

[Date]2019-02-27
[Paper #]DC2018-71
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines

Yuki Maeda(Hiroshima City Univ.),  Hideyuki Ichihara(Hiroshima City Univ.),  Tsuyoshi Iwagaki(Hiroshima City Univ.),  Tomoo Inoue(Hiroshima City Univ.),  

[Date]2019-02-27
[Paper #]DC2018-81
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing

Tomoki Aono(Ehime Univ.),  Hanan T.Al-Awadhi(Ehime Univ.),  Senling Wang(Ehime Univ.),  Yoshinobu Higami(Ehime Univ.),  Hiroshi Takahashi(Ehime Univ.),  Hiroyuki Iwata(Renesas),  Yoichi Maeda(Renesas),  Jun Matsushima(Renesas),  

[Date]2019-02-27
[Paper #]DC2018-79
Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test

Tomoki Mino(NAIST),  Shintani Michihiro(NAIST),  Michiko Inoue(NAIST),  

[Date]2019-02-27
[Paper #]DC2018-75
Reliability evaluation of the optical navigation electronics of HAYABUSA2

Hiroki Hihara(NECSpace/NEC),  Junpei Sano(NECSpace),  Tetsuya Masuda(NEC),  Hisashi Otake(JAXA),  Tatsuaki Okada(JAXA),  Naoko Ogawa(JAXA),  Yuichi Tsuda(JAXA),  

[Date]2019-02-27
[Paper #]DC2018-84
Analysis of the hotspot distribution in the LSI

Yudai Kawano(Kyutech),  Kohei Miyase(Kyutech),  Shyue-Kung Lu(NTUST),  Xiaoqing Wen(Kyutech),  Seiji Kajihara(Kyutech),  

[Date]2019-02-27
[Paper #]DC2018-74