IEICE Technical Committee

Information and Systems-Image Engineering(Date:2018/08/07)

Presentation

[Invited Talk] A Battery Management System for Wireless Sensor Devices

Ken-ichi Kawasaki(Fujitsu Labs.), Jun-ichi Nagata(Fujitsu Labs.), Hiroyuki Nakamoto(Fujitsu Labs.),

[Date]2018-08-07
[Paper #]SDM2018-34,ICD2018-21

[Invited Talk] Development of SiGe-MEMS-on-CMOS technology for ultra-low-power inertial sensors

Hideyuki Tomizawa(Toshiba), Yoshihiko Kurui(Toshiba), Ippei Akita(AIST), Akira Fujimoto(Toshiba), Tomohiro Saito(Toshiba), Akihiro Kojima(Toshiba), Hideki Shibata(Toshiba),

[Date]2018-08-07
[Paper #]SDM2018-29,ICD2018-16

[Invited Talk] Fabrication and Characterization of SOI-CMOS Using Minimal-Fab and Mega-Fab Hybrid Process

Yongxun Liu(AIST), Hiroyuki Tanaka(AIST), Kazuhiro Koga(MINIMAL), Kazushige Sato(MINIMAL), Sommawan Khumpuang(AIST), Masayoshi Nagao(AIST), Takashi Matsukawa(AIST), Shiro Hara(AIST),

[Date]2018-08-07
[Paper #]SDM2018-30,ICD2018-17

[Invited Talk] Energy Harvesting Beat Sensors and Potential Applications

Koichiro Ishibashi(UEC),

[Date]2018-08-07
[Paper #]SDM2018-27,ICD2018-14

A 0.6V 9bit PWM Differential Arithmetic Circuit

Fumiya Kojima(Yamagata Univ), Tomochika Harada(Yamagata Univ),

[Date]2018-08-07
[Paper #]SDM2018-32,ICD2018-19

A 65nm SOTB Based-On Code-Modulated Synchronized-OOK Transmitter for Normally-Off Wireless Sensor Networks

Van-Trung Nguyen(The UEC), Ryo Ishikawa(The UEC), Koichiro Ishibashi(The UEC),

[Date]2018-08-07
[Paper #]SDM2018-33,ICD2018-20

Experiment of Ultralow Voltage Rectification by Super Steep SS "PN-Body Tied SOI-FET"

Shun Momose(KIT), Jiro Ida(KIT), Takuya Yamada(KIT), Takayuki Mori(KIT), Kenji Itoh(KIT), Koichiro Ishibashi(UEC), Yasuo Arai(KEK),

[Date]2018-08-07
[Paper #]SDM2018-31,ICD2018-18

Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process

Kodai Yamada(KIT), Jun Furuta(KIT), Kazutoshi Kobayashi(KIT),

[Date]2018-08-07
[Paper #]SDM2018-28,ICD2018-15

Power Consumption Estimation by Die Temperature for Processors Implemented on FPGA

Hiroaki Kaneko(Tokyo Denki Univ.), Akinori Kanasugi(Tokyo Denki Univ.),

[Date]2018-08-07
[Paper #]SDM2018-35,ICD2018-22

Study of new stacked type logic circuit with fabrication technology of 3D NAND flash memory

Fumiya Suzuki(Shonan Inst. of Tech.), Sigeyoshi Watanabe(Shonan Inst. of Tech.),

[Date]2018-08-08
[Paper #]SDM2018-43,ICD2018-30

[Invited Lecture] A Highly Symmetrical 10T 2-Read/Write Dual-port SRAM Bitcell Design In 28nm High-k/Metal-gate Planar Bulk CMOS Technology

Yuichiro Ishii(Renesas), Miki Tanaka(Renesas), Makoto Yabuuchi(Renesas), Yohei Sawada(Renesas), Shinji Tanaka(Renesas), Koji Nii(Renesas), Tien Yu Lu(UMC), Chun Hsien Huang(UMC), Shou Sian Chen(UMC), Yu Tse Kuo(UMC), Ching Cheng Lung(UMC), Osbert Cheng(UMC),

[Date]2018-08-08
[Paper #]SDM2018-40,ICD2018-27

[Invited Talk] Neuromorphic Operation using an Atom/Ion Movement-Type Device

Takeo Ohno(Oita Univ.),

[Date]2018-08-08
[Paper #]SDM2018-38,ICD2018-25

Proposal of reconfigurable system LSI with 3D flashtechnology and its application to combinationlogic, FF circuit and FPGA

Shigeyoshi Watanabe(Shonan Insti. of Tech.),

[Date]2018-08-08
[Paper #]SDM2018-42,ICD2018-29

[Invited Talk] Research Progress on Resistance Change Device Based on Oxide Materials

Hisashi Shima(AIST), Makoto Takahashi(AIST), Yasuhisa Naitoh(AIST), Hiroyuki Akinaga(AIST),

[Date]2018-08-08
[Paper #]SDM2018-36,ICD2018-23

Measurements and Analysis of Power Supply Noise in Digital IC Chip

Kosuke Jike(Kobe Univ), Akihiro Tsukioka(Kobe Univ), Ryohei Sawada(Kobe Univ), Koh Watanabe(Kobe Univ), Noriyuki Miura(Kobe Univ), Makoto Nagata(Kobe Univ),

[Date]2018-08-08
[Paper #]SDM2018-39,ICD2018-26

[Invited Talk] CMOS Annealing Machine for Combinatorial Optimization Problems

Masanao Yamaoka(Hitachi),

[Date]2018-08-08
[Paper #]SDM2018-41,ICD2018-28

Understanding Temperature Effect on Subthreshold Slope Variability in Bulk and SOTB MOSFETs

Shuang Gao(Univ. Tokyo), Tomoko Mizutani(Univ. Tokyo), Kiyoshi Takeuchi(Univ. Tokyo), Masaharu Kobayashi(Univ. Tokyo), Toshiro Hiramoto(Univ. Tokyo),

[Date]2018-08-08
[Paper #]SDM2018-37,ICD2018-24

[Invited Talk] Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic

Ryusuke Nebashi(NEC), Naoki Banno(NEC), Makoto Miyamura(NEC), Ayuka Morioka(NEC), Bai Xu(NEC), Koichiro Okamoto(NEC), Noriyuki Iguchi(NEC), Hideaki Numata(NEC), Hiromitsu Hada(NEC), Tadahiko Sugibayashi(NEC), Toshitsugu Sakamoto(NEC), Munehiro Tada(NEC),

[Date]2018-08-09
[Paper #]SDM2018-51,ICD2018-38

[Invited Talk] Non-Contact Unobtrusive Sensing of Multiple Vital Signals Using Capacitive Coupling

Akinori Ueno(Tokyo Denki Univ.),

[Date]2018-08-09
[Paper #]SDM2018-45,ICD2018-32

Effect of multiple stress application in post-fabrication cell stability self-improvement in SRAM cell array

Tomoko Mizutani(Univ. of Tokyo), Kiyoshi Takeuchi(Univ. of Tokyo), Takuya Saraya(Univ. of Tokyo), Masaharu Kobayashi(Univ. of Tokyo), Toshiro Hiramoto(Univ. of Tokyo),

[Date]2018-08-09
[Paper #]SDM2018-49,ICD2018-36