Information and Systems-Image Engineering(Date:2018/01/30)

Presentation
[Invited Talk] Perspective of Negative Capacitance FinFETs Investigated by Transient TCAD Simulation

Hiroyuki Ota(AIST),  Shinji Mgita(AIST),  Tsutomu Ikegami(AIST),  Junichi Hattori(AIST),  Hidehiro Asai(AIST),  Koichi Fukuda(AIST),  Akira Toriumi(The Univ. of Tokyo),  

[Date]2018-01-30
[Paper #]SDM2017-91
[Invited Talk] Proposal and demonstration of oxide-semiconductor/(Si, SiGe, Ge) bilayer tunneling field effect transistor with type-II energy band alignment

Kimihiko Kato(Univ. of Tokyo),  Hiroaki Matsui(Univ. of Tokyo),  Hitoshi Tabata(Univ. of Tokyo),  Mitsuru Takenaka(Univ. of Tokyo),  Shinichi Takagi(Univ. of Tokyo),  

[Date]2018-01-30
[Paper #]SDM2017-92
[Invited Talk] Lateral Charge Migration Suppression Technique of 3D-NAND Flash by Vth Nearing

Kyoji Mizoguchi(Chuo Univ.),  Shohei Kotaki(Chuo Univ.),  Yoshiaki Deguchi(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2018-01-30
[Paper #]SDM2017-93
[Invited Talk] Reliability and Scalability of FinFET Split-Gate MONOS Array with Tight Vth Distribution for 16/14nm-node Embedded Flash

Shibun Tsuda(renesas),  Tomoya Saito(renesas),  Hirokazu Nagase(renesas),  Yoshiyuki Kawashima(renesas),  Atsushi Yoshitomi(renesas),  Shinobu Okanishi(renesas),  Tomohiro Hayashi(renesas),  Takuya Maruyama(renesas),  Masao Inoue(renesas),  Seiji Muranaka(renesas),  Shigeki Kato(renesas),  Takuya Hagiwara(renesas),  Hirokazu Saito(renesas),  Tadashi Yamaguchi(renesas),  Masaru Kadoshima(renesas),  Takahiro Maruyama(renesas),  Tatsuyoshi Mihara(renesas),  Hiroshi Yanagita(renesas),  Kenichiro Sonoda(renesas),  Tomohiro Yamashita(renesas),  Yasuo Yamaguchi(renesas),  

[Date]2018-01-30
[Paper #]SDM2017-94
[Invited Talk] STDP synapse with outstanding stability based on a novel insulator-to-metal transition FET

Pablo Stoliar(nanoGUNE),  Alejandro Schulman(AIST),  Ai Kitoh(AIST),  Akihito Sawa(AIST),  Isao H. Inoue(AIST),  

[Date]2018-01-30
[Paper #]SDM2017-95
[Invited Talk] Sub-nm EOT Ferroelectric HfO2 on p+Ge with Highly Reliable Field Cycling Properties

Xuan Tian(Univ. of Tokyo),  Lun Xu(Univ. of Tokyo),  Shigehisa Shibayama(Univ. of Tokyo),  Tomonori Nishimura(Univ. of Tokyo),  Takeaki Yajima(Univ. of Tokyo),  Shinji Migita(AIST),  Akira Toriumi(Univ. of Tokyo),  

[Date]2018-01-30
[Paper #]SDM2017-96