Presentation | |
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Ken Hirano(Kanazawa Institute of Technology), Shigeru Makino(Kanazawa Institute of Technology), Keisuke Noguchi(Kanazawa Institute of Technology), Kenji Itoh(Kanazawa Institute of Technology), Tetsuo Hirota(Kanazawa Institute of Technology), [Date]2017-11-08[Paper #]AP2017-110 | |
Kazuyuki Sakoda(NIT, Miyakonojo College/Kagoshima Univ.), Hiroki Hata(Kagoshima Univ.), Shigefumi Hata(Kagoshima Univ.), [Date]2017-11-08[Paper #]RCS2017-222 | |
Kouichi Sugita(Takushoku Univ.), Yasuhiro Higuma(Takushoku Univ.), Yasuhiro Tsunemitsu(Takushoku Univ.), [Date]2017-11-08[Paper #]AP2017-107 | |
Yasuhiro Tsunemitsu(Takushoku Univ.), Kouichi Sugita(Takushoku Univ.), Yasuhiro Higuma(Takushoku Univ.), Mabunsaga Phenthip(Takushoku Univ.), [Date]2017-11-08[Paper #]AP2017-108 | |
Keigo Shimizu(Nagasaki Univ.), Takafumi Fujimoto(Nagasaki Univ.), [Date]2017-11-08[Paper #]AP2017-111 | |
Kentaro Nishimori(Niigata Univ.), Naoki Matsumura(Niigata Univ.), Ryotaro Taniguchi(Niigata Univ.), Tsutomu Mitsui(Niigata Univ.), Takefumi Hiraguri(NIT), [Date]2017-11-08[Paper #]AP2017-116,RCS2017-213 | |
Hiroki Ushiroda(Saga Univ.), Eisuke Nishiyama(Saga Univ.), Ichihiko Toyoda(Saga Univ.), [Date]2017-11-08[Paper #]AP2017-112 | |
Rei Nagashima(Keio Univ.), Tomoaki Ohtsuki(Keio Univ.), Wenjie Jiang(NTT), Yasushi Takatori(NTT), [Date]2017-11-08[Paper #]RCS2017-221 | |
Atsushi Ohta(NTT), Satoshi Kurosaki(NTT), Kazuto Goto(NTT), Yutaka Imaizumi(NTT), Naoki Kita(NTT), [Date]2017-11-08[Paper #]RCS2017-218 | |
Tsukasa Matsuta(Univ.Fukui), Toshikazu Hori(Univ.Fukui), Mitoshi Fujimoto(Univ.Fukui), Koshiro Kitao(NTT Docomo), Tetsuro Imai(NTT Docomo), [Date]2017-11-08[Paper #]AP2017-118,RCS2017-215 | |
Ryota Nakao(Kogakuin Univ.), Jun Mashino(NTT DOCOMO), Satoshi Suyama(NTT DOCOMO), Hiroyuki Otsuka(Kogakuin Univ.), [Date]2017-11-08[Paper #]RCS2017-219 | |
Yuta Mizuno(NIT), Kunio Sakakibara(NIT), Nobuyoshi Kikuma(NIT), Kojiro Iwasa(PILLAR), [Date]2017-11-08[Paper #]AP2017-109 | |
Naoto Setoguchi(Chiba Inst.Tech.), Hiroaki Nakabayashi(Chiba Inst.Tech.), Keizo Cho(Chiba Inst.Tech.), [Date]2017-11-08[Paper #]AP2017-117,RCS2017-214 | |
Tomoya Kaneko(NEC), Toshihide Kuwabara(NEC), Noriaki Tawa(NEC), Masaaki Tanio(NEC), Kousuke Tanabe(NEC), Kazuaki Kunihiro(NEC), [Date]2017-11-08[Paper #]AP2017-113,RCS2017-210 | |
Xiao Peng(NEC), Naoto Ishii(NEC), [Date]2017-11-08[Paper #]RCS2017-216 | |
Tomoki Murakami(NTT), Koichi Ishihara(NTT), Hirantha Abeysekera(NTT), Mamoru Akimoto(NTT), Yasushi Takatori(NTT), [Date]2017-11-08[Paper #]RCS2017-223 | |
Masahiro Kudo(Keio Univ.), Tomoaki Ohtsuki(Keio Univ.), [Date]2017-11-08[Paper #]RCS2017-208 | |
Tomoki Maruko(NTT DCOMO), Riichi Kudo(NTT DCOMO), Shinpei Yasukawa(NTT DCOMO), Satoshi Nagata(NTT DCOMO), Mikio Iwamura(NTT DCOMO), Takehiro Nakamura(NTT DCOMO), [Date]2017-11-08[Paper #]RCS2017-217 | |
Hideshi Murai(Ericsson Japan), Shoji Itoh(Ericsson Japan), Arne Simonsson(Ericsson Research), Okvist Peter(Ericsson Research), [Date]2017-11-08[Paper #]AP2017-114,RCS2017-211 | |
Amitava Ghosh(Nokia), [Date]2017-11-08[Paper #]AP2017-115,RCS2017-212 |