Presentation | |
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Tetsuo Kodera(Tokyo Inst. of Tech.), [Date]2017-07-31[Paper #]SDM2017-36,ICD2017-24 | |
Shuichiro Yasuda(Sony Semiconductor Solutions), Kazuhiro Ohba(Sony Semiconductor Solutions), Tetsuya Mizuguchi(Sony Semiconductor Solutions), Hiroaki Sei(Sony Semiconductor Solutions), Masayuki Shimuta(Sony Semiconductor Solutions), Katsuhisa Aratani(Sony Semiconductor Solutions), Tsunenori Shiimoto(Sony Semiconductor Solutions), Tetsuya Yamamoto(Sony Semiconductor Solutions), Takeyuki Sone(Sony Semiconductor Solutions), Seiji Nonoguchi(Sony Semiconductor Solutions), Jun Okuno(Sony Semiconductor Solutions), Akira Kouchiyama(Sony Semiconductor Solutions), Wataru Otsuka(Sony Semiconductor Solutions), Keiichi Tsutsui(Sony Semiconductor Solutions), [Date]2017-07-31[Paper #]SDM2017-34,ICD2017-22 | |
Makoto Yabuuchi(Renesas), Koji Nii(Renesas), Shinji Tanaka(Renesas), Shinozaki Yoshihiro(Nippon Systemware), Yoshiki Yamamoto(Renesas), Takumi Hasegawa(Renesas), Hiroki Shinkawata(Renesas), Shiro Kamohara(Renesas), [Date]2017-07-31[Paper #]SDM2017-33,ICD2017-21 | |
Shinya Takamaeda(Hokkaido Univ.), [Date]2017-07-31[Paper #]SDM2017-31,ICD2017-19 | |
Hidehiro Asai(AIST), Takahiro Mori(AIST), Junich Hattori(AIST), Koichi Fukuda(AIST), Kazuhiko Endo(AIST), Takashi Matsukawa(AIST), [Date]2017-07-31[Paper #]SDM2017-35,ICD2017-23 | |
Tomochika Harada(Yamagata Univ.), [Date]2017-07-31[Paper #]SDM2017-32,ICD2017-20 | |
Guoqiang Zhang(Renesas Electronics), Kosuke Yayama(Renesas Electronics), Akio Katsushima(Renesas Electronics), Takahiro Miki(Renesas Electronics), [Date]2017-08-01[Paper #]SDM2017-39,ICD2017-27 | |
Yoshinao Kobayashi(Univ. of Tokyo), Nobutsugu Higo(SLDJ), [Date]2017-08-01[Paper #]SDM2017-40,ICD2017-28 | |
Takuya Yamaguchi(Meiji Univ.), Tatsuya Oku(Meiji Univ.), Kawori Sekine(Meiji Univ.), [Date]2017-08-01[Paper #]SDM2017-41,ICD2017-29 | |
Masaharu Kobayashi(Univ. of Tokyo), Nozomu Ueyama(Univ. of Tokyo), Toshiro Hiramoto(Univ. of Tokyo), [Date]2017-08-01[Paper #]SDM2017-37,ICD2017-25 | |
Tomoko Mizutani(Univ. of Tokyo), Kiyoshi Takeuchi(Univ. of Tokyo), Takuya Saraya(Univ. of Tokyo), Hirofumi Shinohara(Waseda Univ.), Masaharu Kobayashi(Univ. of Tokyo), Toshiro Hiramoto(Univ. of Tokyo), [Date]2017-08-01[Paper #]SDM2017-38,ICD2017-26 | |
Takeaki Yajima(Univ. of Tokyo), Tomonori Nishimura(Univ. of Tokyo), Akira Toriumi(Univ. of Tokyo), [Date]2017-08-02[Paper #]SDM2017-44,ICD2017-32 | |
Takumi Kamo(Tokyo Univ. of Science), Yohtaro Umeda(Tokyo Univ. of Science), Yusuke Kozawa(Ibaraki Univ.), [Date]2017-08-02[Paper #]SDM2017-47,ICD2017-35 | |
Takumi Yamamoto(Tokyo Univ. of Science), Yohtaro Umeda(Tokyo Univ. of Science), Yusuke Kozawa(Ibaraki Univ.), [Date]2017-08-02[Paper #]SDM2017-48,ICD2017-36 | |
Kentaro Yoshioka(Toshiba), Tomohiko Sugimoto(Toshiba), Naoya Waki(Toshiba), Sinnyoung Kim(Toshiba), Daisuke Kurose(Toshiba), Hirotomo Ishii(Toshiba), Masanori Fururta(Toshiba), Akihide Sai(Toshiba), Tetsuro Itakura(Toshiba), [Date]2017-08-02[Paper #]SDM2017-46,ICD2017-34 | |
Shun Momose(KIT), Jiro Ida(KIT), Takayuki Mori(KIT), Takahiro Yoshida(KIT), Junpei Iwata(KIT), Takashi Horii(KIT), Takahiro Furuta(KIT), Takuya Yamada(KIT), Daichi Takamatsu(KIT), Kenji Itoh(KIT), Koichiro Ishibashi(UEC), Yasuo Arai(KEK), [Date]2017-08-02[Paper #]SDM2017-45,ICD2017-33 | |
Kota Ando(Hokkaido Univ.), Kodai Ueyoshi(Hokkaido Univ.), Kentaro Orimo(Hokkaido Univ.), Haruyoshi Yonekawa(Tokyo Inst. of Tech.), Shinpei Sato(Tokyo Inst. of Tech.), Hiroki Nakahara(Tokyo Inst. of Tech.), Masayuki Ikebe(Hokkaido Univ.), Tetsuya Asai(Hokkaido Univ.), Shinya Takamaeda(Hokkaido Univ.), Tadahiro Kuroda(Keio Univ.), Masato Motomura(Hokkaido Univ.), [Date]2017-08-02[Paper #]SDM2017-43,ICD2017-31 | |
Toshimasa Matsuoka(Osaka Univ.), Takatsugu Kamata(SPChange), Masayuki Ueda(SPChange), Yusaku Hirai(Osaka Univ.), Sadahiro Tani(Osaka Univ.), Tomohiro Asano(Osaka Univ.), Shodai Isami(Osaka Univ.), Toshifumi Kurata(Osaka Univ.), Keiji Tatsumi(Osaka Univ.), [Date]2017-08-02[Paper #]SDM2017-42,ICD2017-30 | |
Toru Kawajiri(Keio Univ.), Hiroki Ishikuro(Keio Univ.), [Date]2017-08-02[Paper #]SDM2017-49,ICD2017-37 |