Presentation | |
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Daisuke Saida(Toshiba), Saori Kashiwaad(Toshiba), Megumi Yakabe(Toshiba), Tadaomi Daibou(Toshiba), Junichi Ito(Toshiba), Hiroki Noguchi(Toshiba), Keiko Abe(Toshiba), Shinobu Fujita(Toshiba), Miyoshi Fukumoto(Osaka Univ.), Shinji Miwa(Osaka Univ.), Yoshishige Suzuki(Osaka Univ.), [Date]2017-04-20[Paper #]ICD2017-2 | |
Kota Tsurumi(Chuo Univ.), Masahiro Tanaka(Chuo Univ.), Ken Takeuchi(Chuo Univ.), [Date]2017-04-20[Paper #]ICD2017-5 | |
Kenji Tsuchida(Toshiba), Kwangmyoung Rho(SK hynix), Dongkeun Kim(SK hynix), Yutaka Shirai(Toshiba), Jihyae Bae(SK hynix), Tsuneo Inaba(Toshiba), Hiromi Noro(Toshiba), Hyunin Moon(SK hynix), Sungwoong Chung(SK hynix), Kazumasa Sunouchi(Toshiba), Jinwon Park(SK hynix), Kiseon Park(SK hynix), Akihito Yamamoto(Toshiba), Seoungju Chung(SK hynix), Hyeongon Kim(SK hynix), [Date]2017-04-20[Paper #]ICD2017-3 | |
Shibun Tsuda(Renesas Electronics), Yoshiyuki Kawashima(Renesas Electronics), Kenichiro Sonoda(Renesas Electronics), Atsushi Yoshitomi(Renesas Electronics), Tatsuyoshi Mihara(Renesas Electronics), Shunichi Narumi(Renesas Electronics), Masao Inoue(Renesas Electronics), Seiji Muranaka(Renesas Electronics), Takahiro Maruyama(Renesas Electronics), Tomohiro Yamashita(Renesas Electronics), Yasuo Yamaguchi(Renesas Electronics), Digh Hisamoto(Hitachi), [Date]2017-04-20[Paper #]ICD2017-7 | |
Masaya Nakano(Renesas Electronics), Takashi Ito(Renesas Electronics), Tadaaki Yamauchi(Renesas Electronics), Yasuo Yamaguchi(Renesas Electronics), Takashi Kono(Renesas Electronics), Hideto Hidaka(Renesas Electronics), [Date]2017-04-20[Paper #]ICD2017-8 | |
Hiroaki Yoda(Toshiba), Naoharu Simomura(Toshiba), Yuichi Osawa(Toshiba), Satoshi Shiratori(Toshiba), Yushi Kato(Toshiba), Iguchi Tomoaki(Toshiba), Yuzou Kamiguchi(Toshiba), Buyandalai Altansargai(Toshiba), Yoshiaki Saito(Toshiba), Katsuhiko Koi(Toshiba), Sugiyama Hideyuki(Toshiba), Souichi Oikawa(Toshiba), Shimizu Mariko(Toshiba), Miaue Ishikawa(Toshiba), Kazutaka Ikegami(Toshiba), [Date]2017-04-20[Paper #]ICD2017-1 | |
Toshiki Nakamura(Chuo Univ.), Atsuro Kobayashi(Chuo Univ.), Ken Takeuchi(Chuo Univ.), [Date]2017-04-20[Paper #]ICD2017-6 | |
Ryuji Yamashita(WDC), Sagar Magia(WDC), Tsutomu Higuchi(Toshiba), Kazuhide Yoneya(Toshiba), Toshio Yamamura(Toshiba), Hiroyuki Mizukoshi(WDC), Shingo Zaitsu(WDC), Minoru Yamashita(WDC), Shunichi Toyama(WDC), Norihiro Kamae(WDC), Juan Lee(WDC), Shuo Chen(WDC), Jiawei Tao(WDC), William Mak(WDC), Xiaohua Zhang(WDC), [Date]2017-04-20[Paper #]ICD2017-9 | |
Tsuyoshi Watanabe(Kobe Univ.), Noriyuki Miura(Kobe Univ.), Shijia Liu(Kobe Univ.), Shigeki Imai(Kobe Univ.), Makoto Nagata(Kobe Univ.), [Date]2017-04-20[Paper #]ICD2017-4 | |
Yohei Sawada(REL), Makoto Yabuuchi(REL), Masao Morimoto(REL), Toshiaki Sano(RSD), Yuichiro Ishii(REL), Shinji Tanaka(REL), Miki Tanaka(RSD), Koji Nii(REL), [Date]2017-04-21[Paper #]ICD2017-12 | |
Harsh N. Patel(UVA), Abhishek Roy(UVA), Farah B. Yahya(UVA), Ningxi Liu(UVA), Benton Calhoun(UVA), Akihiko Harada(FEA), Kazuyuki Kumeno(MIFS), Makoto Yasuda(MIFS), Taiji Ema(MIFS), [Date]2017-04-21[Paper #]ICD2017-11 | |
Tsutomu Haruta(Sony Semiconductor Solutions), Tsutomu Nakajima(Sony Semiconductor Solutions), Jun Hashizume(Sony Semiconductor Solutions), Taku Umebayashi(Sony Semiconductor Solutions), Hiroshi Takahashi(Sony Semiconductor Solutions), Kazuo Taniguchi(Sony Semiconductor Solutions), Masami Kuroda(Sony Semiconductor Solutions), Hiroshi Sumihiro(Sony Semiconductor Solutions), Koji Enoki(Sony Semiconductor Solutions), Takatsugu Yamasaki(Sony Semiconductor Manufacturing), Katsuya Ikezawa(Sony Semiconductor Solutions), Atsushi Kitahara(Sony Semiconductor Solutions), Masao Zen(Sony Semiconductor Solutions), Masafumi Oyama(Sony Semiconductor Solutions), Hiroki Koga(Sony Semiconductor Solutions), [Date]2017-04-21[Paper #]ICD2017-18 | |
Shinichi Yasuda(Toshiba), Masato Oda(Toshiba), Mari Matsumoto(Toshiba), Kosuke Tatsumura(Toshiba), Koichiro Zaitsu(Toshiba), Ying-Hao Ho(Toshiba), Mizuki Ono(Toshiba), [Date]2017-04-21[Paper #]ICD2017-15 | |
Daiki Kitagata(Tokyo Inst. of Tech.), Yusuke Shuto(Tokyo Inst. of Tech.), Shuu'ichirou Yamamoto(Tokyo Inst. of Tech.), Satoshi Sugahara(Tokyo Inst. of Tech.), [Date]2017-04-21[Paper #]ICD2017-10 | |
Marina Yamaguchi(Toshiba), Shosuke Fujii(Toshiba), Yuuichi Kamimuta(Toshiba), Tsunehiro Ino(Toshiba), Riichiro Takaishi(Toshiba), Yasushi Nakasaki(Toshiba), Masumi Saitoh(Toshiba), [Date]2017-04-21[Paper #]ICD2017-16 | |
Tatsuya Onuki(Semiconductor Energy Laboratory), Atsuo Isobe(Semiconductor Energy Laboratory), Yoshinori Ando(Semiconductor Energy Laboratory), Satoru Okamoto(Semiconductor Energy Laboratory), Kiyoshi Kato(Semiconductor Energy Laboratory), T R Yew(United Microelectronics Corporation), Chen Bin Lin(United Microelectronics Corporation), J Y Wu(United Microelectronics Corporation), Chi Chang Shuai(United Microelectronics Corporation), Shao Hui Wu(United Microelectronics Corporation), James Myers(ARM), Klaus Doppler(Nokia Technologies), Masahiro Fujita(The Univ. of Tokyo), Shunpei Yamazaki(Semiconductor Energy Laboratory), [Date]2017-04-21[Paper #]ICD2017-17 | |
Yukihide Tsuji(NEC), Xu Bai(NEC), Ayuka Morioka(NEC), Miyamura Makoto(NEC), Ryusuke Nebashi(NEC), Toshitsugu Sakamoto(NEC), Munehiro Tada(NEC), Naoki Banno(NEC), Koichiro Okamoto(NEC), Noriyuki Iguchi(NEC), Hiromitsu Hada(NEC), Tadahiko Sugibayashi(NEC), [Date]2017-04-21[Paper #]ICD2017-14 | |
Koichiro Okamoto(NEC), Munehiro Tada(NEC), Naoki Banno(NEC), Noriyuki Iguchi(NEC), Hiromitsu Hada(NEC), Toshitsugu Sakamoto(NEC), Makoto Miyamura(NEC), Yukihide Tsuji(NEC), Ryusuke Nebashi(NEC), Ayuka Morioka(NEC), Xu Bai(NEC), Tadahiko Sugibayashi(NEC), [Date]2017-04-21[Paper #]ICD2017-13 |