Information and Systems-Image Engineering(Date:2017/01/30)

Presentation
[Invited Talk] Demonstrating Performance Improvement of Complementary TFET Circuits by ION Enhancement Based on Isoelectronic Trap Technology

Takahiro Mori(ANational Institute of Advanced Industrial ScieIST),  Hidehiro Asai(ANational Institute of Advanced Industrial ScieIST),  Junichi Hattori(ANational Institute of Advanced Industrial ScieIST),  Koichi Fukuda(ANational Institute of Advanced Industrial ScieIST),  Shintaro Otsuka(ANational Institute of Advanced Industrial ScieIST),  Yukinori Morita(ANational Institute of Advanced Industrial ScieIST),  Shin-ichi O'uchi(ANational Institute of Advanced Industrial ScieIST),  Hiroshi Fuketa(ANational Institute of Advanced Industrial ScieIST),  Shinji Migita(ANational Institute of Advanced Industrial ScieIST),  Wataru Mizubayashi(ANational Institute of Advanced Industrial ScieIST),  Hiroyuki Ota(ANational Institute of Advanced Industrial ScieIST),  Takashi Matuskawa(ANational Institute of Advanced Industrial ScieIST),  

[Date]2017-01-30
[Paper #]SDM2016-130
[Invited Talk] Tunneling MOSFET Technologies using III-V/Ge Materials

Shinichi Takagi(Univ. of Tokyo),  Daehwan Ahn(Univ. of Tokyo),  Munetaka Noguchi(Univ. of Tokyo),  Takahiro Gotow(Univ. of Tokyo),  Koichi Nishi(Univ. of Tokyo),  Min-Soo Kim(Univ. of Tokyo),  Mitsuru Takenaka(Univ. of Tokyo),  

[Date]2017-01-30
[Paper #]SDM2016-131
[Invited Talk] Experimental Study on Polarization-Limited Operation Speed of Negative Capacitance FET with Ferroelectric HfO2

Masaharu Kobayashi(Univ. of Tokyo),  (Univ. of Tokyo),  (Univ. of Tokyo),  (Univ. of Tokyo),  

[Date]2017-01-30
[Paper #]SDM2016-132
[Invited Talk] Fully Coupled 3-D Device Simulation of Negative Capacitance FinFETs for Sub 10 nm Integration

Hiroyuki Ota(AIST),  Tsutomu Ikegami(AIST),  Junichi Hattori(AIST),  Koichi Fukuda(AIST),  Shinji Migita(AIST),  Akira Toriumi(The Univ. of Tokyo),  

[Date]2017-01-30
[Paper #]SDM2016-133
[Invited Talk] First Demonstration of FinFET Split-Gate MONOS for High-Speed and Highly-Reliable Embedded Flash in 16/14nm-node and Beyond

Shibun Tsuda(Renesas Electronics),  Yoshiyuki Kawashima(Renesas Electronics),  Kenichiro Sonoda(Renesas Electronics),  Atsushi Yoshitomi(Renesas Electronics),  Tatsuyoshi Mihara(Renesas Electronics),  Shunichi Narumi(Renesas Electronics),  Masao Inoue(Renesas Electronics),  Seiji Muranaka(Renesas Electronics),  Takahiro Maruyama(Renesas Electronics),  Tomohiro Yamashita(Renesas Electronics),  Yasuo Yamaguchi(Renesas Electronics),  Digh Hisamoto(Hitachi),  

[Date]2017-01-30
[Paper #]SDM2016-134
[Invited Talk] Novel Voltage Controlled MRAM (VCM) with Fast Read/Write Circuits for Ultra Large Level Cache

Yoichi Shiota(AIST),  Hiroki Noguchi(Toshiba),  Kazutaka Ikegami(Toshiba),  Keiko Abe(Toshiba),  Shinobu Fujita(Toshiba),  Takayuki Nozaki(AIST),  Shinji Yuasa(AIST),  Yoshishige Suzuki(Osaka Univ.),  

[Date]2017-01-30
[Paper #]SDM2016-135
[Invited Talk] Voltage-Control Spintronics Memory (VOCSM)Having Potentials of Ultra-Low Energy-Consumption and High-Density

Hiroaki Yoda(Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  (Toshiba),  

[Date]2017-01-30
[Paper #]SDM2016-136
[Invited Talk] General relationship for cation and anion doping effects on ferroelectric HfO2 formation

Xu Lun(Univ. of Tokyo),  Shibayama Shigehisa(Univ. of Tokyo),  Izukashi Kazutaka(Univ. of Tokyo),  Nishimura Tomonori(Univ. of Tokyo),  Yajima Takeaki(Univ. of Tokyo),  Migita Shinji(AIST),  Toriumi Akira(Univ. of Tokyo),  

[Date]2017-01-30
[Paper #]SDM2016-137
[Invited Talk] Novel Functional Passive Element for Future Analogue Signal Processing

Takeaki Yajima(Univ. of Tokyo),  Tomonori Nishimura(Univ. of Tokyo),  Akira Toriumi(Univ. of Tokyo),  

[Date]2017-01-30
[Paper #]SDM2016-138