Information and Systems-Image Engineering(Date:2016/12/15)

Presentation
[Poster Presentation] Pressure Sensor for Artificial Knee Joint Replacement

Fumika Tanabe(Osaka Univ.),  Shusuke Yoshimoto(Osaka Univ.),  Yuki Noda(Osaka Univ.),  Teppei Araki(Osaka Univ.),  Takafumi Uemura(Osaka Univ.),  Yoshinori Takeuchi(Osaka Univ.),  Masaharu Imai(Osaka Univ.),  Tsuyoshi Sekitani(Osaka Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-62,CPSY2016-68
[Invited Talk] Circuit and System Design using Flexible Sensor with Cross-Sectoral Cooperation

Shusuke Yoshimoto(Osaka Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-55,CPSY2016-61
[Invited Talk] Computer Infrastructure for Utilizing Big Data

Hiroki Matsutani(Keio Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-56,CPSY2016-62
[Poster Presentation] Study of the capacitor ratio adjustment method that takes into account the parasitic capacitance of MOS switch in Capacitor-DAC

Yoshiharu Miyake(SIT),  Masahiro Sasaki(SIT),  

[Date]2016-12-15
[Paper #]ICD2016-63,CPSY2016-69
[Poster Presentation] Analysis of Current Source Transition Timing and Output Current for Glitch Reduction of Current-Steering DAC

Akihiro Usuki(SIT),  Masahiro Sasaki(SIT),  

[Date]2016-12-15
[Paper #]ICD2016-64,CPSY2016-70
[Poster Presentation] Optimal Program Conditions of ReRAM

Atsuna Hayakawa(Chuo Univ.),  Kazuki Maeda(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-65,CPSY2016-71
[Poster Presentation] Analysis of Read Disturb Error in NAND Flash Memory

Hikaru Watanabe(Chuo Univ.),  Atsuro Kobayashi(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-66,CPSY2016-72
[Poster Presentation] High-Speed Operation of Program Voltage Generator for Low-voltage ReRAM

Kenta Suzuki(Chuo Univ.),  Masahiro Tanaka(Chuo Univ.),  Kota Tsurumi(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-67,CPSY2016-73
[Poster Presentation] Performance Evaluation of Storage Class Memory based SSD in Consideration of Reliability

Yutaka Adachi(Chuo Univ.),  Hirofumi Takishita(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-68,CPSY2016-74
[Poster Presentation] Error Pattern Analysis among Scaled Generations of NAND Flash Memories

Yukiya Sakaki(Chuo Univ.),  Yusuke Yamaga(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-69,CPSY2016-75
[Poster Presentation] Error Tendency Analysis of Endurance in ReRAM

Shouhei Fukuyama(Chuo Univ.),  Kazuki Maeda(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-70,CPSY2016-76
[Poster Presentation] Performance Evaluation of Hybrid SSD with Storage Class Memory Performance

Atsuya Suzuki(Chuo Univ.),  Yusuke Sugiyama(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-71,CPSY2016-77
[Poster Presentation] Error Analysis of NAND Flash Memories for Long-Term Storage

Kyoji Mizoguchi(Chuo Univ.),  Tomonori Takahashi(Chuo Univ.),  Seiichi Aritome(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-72,CPSY2016-78
[Poster Presentation] A Highly Reliable Method with Data-Retenrion Characteristics in TLC NAND Flash Memories

Toshiki Nakamura(Chuo Univ.),  Yoshiaki Deguchi(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-73,CPSY2016-79
[Poster Presentation] CMOS Transimpedance Analog Front End Circuit for an Optical Probe Current Sensor

Kousuke Oyangi(Shinshu Univ.),  Kousuke Miyaji(Shinshu Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-74,CPSY2016-80
[Poster Presentation] Design of injection-locked PLL with low-frequency reference clock

Yuuya Masui(OIT),  Naohiro Fujii(OIT),  Mayu Kobayashi(OIT),  Satosi hashimoto(OIT),  Tsutomu Yoshimura(OIT),  Takao kihara(OIT),  

[Date]2016-12-15
[Paper #]ICD2016-75,CPSY2016-81
[Poster Presentation] Reduction of Data-Retention Error in TLC NAND Flash Memories

Yuichi Sato(Chuo Univ.),  Yoshiaki Deguchi(Chuo Univ.),  Atsuro Kobayashi(Chuo Univ.),  Ken Takeuchi(Chuo Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-76,CPSY2016-82
[Poster Presentation] Novel Annealing Model for Ising LSI Based on Implementable Acceptance Function

Yujiro Inoue(TUS),  Kenta Someya(TUS),  Kenta Kushihara(TUS),  Takayuki Kawahara(TUS),  

[Date]2016-12-15
[Paper #]ICD2016-77,CPSY2016-83
[Poster Presentation] An Energy-Autonomous Bio-Sensing System Using a Biofuel Cell and 0.19V 53μW 65nm-CMOS Integrated Supply-Sensing Sensor with a Supply-Insensitive Temperature Sensor and Inductive-Coupling Link for Healthcare IoT

Atsuki Kobayashi(Nagoya Univ.),  Kei Ikeda(Nagoya Univ.),  Kazuo Nakazato(Nagoya Univ.),  Kiichi Niitsu(Nagoya Univ.),  

[Date]2016-12-15
[Paper #]ICD2016-89,CPSY2016-95
[Poster Presentation] Integer DCT for H.265/HEVC using 65 nm SOTB process

Kazuyoshi Noda(Univ of Electro-Communications),  Cong-Kha Pham(Univ of Electro-Communications),  

[Date]2016-12-15
[Paper #]ICD2016-90,CPSY2016-96
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