Information and Systems-Image Engineering(Date:2015/11/19)

Presentation
A Measurement Method for the Extent of Simultaneous Soft Errors

Noboru Masuda(Univ. of Tsukuba),  Moritoshi Yasunaga(Univ. of Tsukuba),  

[Date]2015-11-19
[Paper #]R2015-57
A Study on acceleration test for Life-End Evaluation

Sadanori Ito(ITOKEN),  

[Date]2015-11-19
[Paper #]R2015-60
Reliability Analysis Based on Hierarchical Bayesian Models and Filtering Methodologies

Toru Kaise(Univ. of Hyogo),  

[Date]2015-11-19
[Paper #]R2015-56
A reliability test planning of electronic components for assurance of quality

Toshinari Matsuoka(Mitsubishi Electric),  

[Date]2015-11-19
[Paper #]R2015-59
Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping

Koichi Endo(Toshiba Corp.),  Tomonori Nakamura(Hamamatsu Photonics K.K.),  Koji Nakamae(Osaka Univ.),  

[Date]2015-11-19
[Paper #]R2015-58