Information and Systems-Image Engineering(Date:2015/07/09)

Presentation
Statistical Measurement of Electromagnetic Noise Characteristics of Indirect ESD in Wireless Frequency Bands and Evaluation of Its Influence to Communication Performance

Ryo Nakaya(NIT),  Hidenawo Ando(NIT),  Daisuke Anzai(NIT),  Jianqing Wang(NIT),  Osamu Fujiwara(NIT),  

[Date]2015-07-09
[Paper #]EMCJ2015-35
Analysis of IC chip level electromagnetic noise suppression mechanism of magnetic film

Jingyan Ma(Tohoku Uni.),  Hanae Aoki(Tohoku Uni.),  Masahiro Yamaguchi(Tohoku Uni.),  

[Date]2015-07-09
[Paper #]EMCJ2015-40
Development of Pseudo Myoelectric Signal Generator and ESD Test Evaluation for Artificial Arm

Keisuke Sato(NIT),  Daisuke Anzai(NIT),  Jianqing Wang(NIT),  Osamu Fujiwara(NIT),  

[Date]2015-07-09
[Paper #]EMCJ2015-36
SPICE Model for Common Mode Choke Including Complex Permeability

Katsuya Nomura(TCRDL),  Naoto Kikuchi(TCRDL),  Yoshitoshi Watanabe(TCRDL),  Shuntaro Inoue(TCRDL),  Yoshiyuki Hattori(TCRDL),  

[Date]2015-07-09
[Paper #]EMCJ2015-38
Transmission and Reflection of Periodically Perforated Metal Plates

Akira Hamano(Univ. of Hyogo),  Shinichiro Yamamoto(Univ. of Hyogo),  Tohru Iwai(Kawasaki Techno),  Kenichi Hatakeyama(Univ. of Hyogo),  

[Date]2015-07-09
[Paper #]EMCJ2015-42
Tightly coupled asymmetrically taperd bend in differential transmission lines for high-density mounting

Chenyu Wang(Okayama Univ),  Yoshitaka Toyota(Okayama Univ),  Kengo Iokibe(Okayama Univ),  

[Date]2015-07-09
[Paper #]EMCJ2015-39
Characterization of Absorbing Material Using Multiple Poles Debye Model and Its Application for Wideband Simulation in FDTD Method

Thourn Kosorl(Tokyo Tech),  Takahiro Aoyagi(Tokyo Tech),  Jun-ichi Takada(Tokyo Tech),  

[Date]2015-07-09
[Paper #]EMCJ2015-41
Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing

Keisuke Nakamura(DENSO),  Kenji Sogo(DENSO),  Michiharu Yamada(DENSO),  Kouji Ichikawa(DENSO),  

[Date]2015-07-09
[Paper #]EMCJ2015-32
Measurement Method for Induced Current under Radiated Immunity Test

Yasunori Oguri(DENSO),  Kenji Sogo(DENSO),  Seiji Nagakusa(DENSO),  Makoto Tanaka(DENSO),  

[Date]2015-07-09
[Paper #]EMCJ2015-34
Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits

Hidetoshi Miyahara(Kyoto Univ.),  Nobuaki Ikehara(Kyoto Univ.),  Tohlu Matsushima(Kyoto Univ.),  Takashi Hisakado(Kyoto Univ.),  Osami Wada(Kyoto Univ.),  

[Date]2015-07-09
[Paper #]EMCJ2015-33
Feasibility of Fault Injection Time Estimation Using EM Leakage from Cryptographic Devices

Ko Nakamaura(Tohoku Univ.),  Yu-ichi Hayashi(Tohoku Gakuin Univ.),  Takaaki Mizuki(Tohoku Univ.),  Naofumi Homma(Tohoku Univ.),  Takafumi Aoki(Tohoku Univ.),  Hideaki Sone(Tohoku Univ.),  

[Date]2015-07-09
[Paper #]EMCJ2015-43
A Study of Evaluation Method for Electromagnetic Interference Affecting Digital Communication Systems

Kotaro Ono(NTT),  Ken Okamoto(NTT),  Hidetoshi Tatemichi(NTT),  Kazuhiro Takaya(NTT),  

[Date]2015-07-09
[Paper #]EMCJ2015-31
A Surrogate Model Based Algorithm for Near-Field Reconstruction

Zixuan Huang(電通大/UESTC),  Yoshio Kami(UEC),  Fengchao Xiao(UEC),  

[Date]2015-07-09
[Paper #]EMCJ2015-37