Information and Systems-Dependable Computing(Date:2023/02/28)

Presentation
A Test Generation Method to Identify Multiple Fault Pairs for Improved Fault Diagnosis Resolution

Yuya Chida(NIhon Univ.),  Toshinori Hosokawa(NIhon Univ.),  Koji Yamazaki(Meiji Univ.),  

[Date]2023-02-28
[Paper #]DC2022-83
A Don't-Care Filling Method of Control Signals for Two-Pattern Parallel Test

Xu Haofeng(Nihon Univ.),  Hosokawa Toshinori(Nihon Univ.),  Yoshimura Masayoshi(KSU),  Arai Masayuki(Nihon Univ.),  

[Date]2023-02-28
[Paper #]DC2022-88
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for Embedded Self-Testing

Yangling Xu(Nihon Univ),  Rei Miura(Nihon Univ),  Toshinori Hosokawa(Nihon Univ),  Masayoshi Yoshimura(KSU),  

[Date]2023-02-28
[Paper #]DC2022-89
信頼度計算プログラムに対するメタモルフィックテスティングの適用

Taito Asaji(Osaka Univ.),  Tatsuhiro Tsuchiya(Osaka Univ.),  

[Date]2023-02-28
[Paper #]DC2022-84
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints

Lele Jiang(Osaka Univ.),  Tatsuhiro Tsuchiya(Osaka Univ.),  

[Date]2023-02-28
[Paper #]DC2022-85
Analysis of the Relationship between the Error Recovery and Reliability on Approximate Multipliers

Kozuma, Tamaki(Hiroshima City Univ.),  Wang,Qilin(Hiroshima City Univ.),  Ichihara, Hideyuki(Hiroshima City Univ.),  Inoue, Tomoo(Hiroshima City Univ.),  

[Date]2023-02-28
[Paper #]DC2022-86
Stochastic flash ADC with variable input voltage range

Taira Sakaguchi(Tokyo Denki Univ.),  Satoshi Komatsu(Tokyo Denki Univ.),  

[Date]2023-02-28
[Paper #]DC2022-90
Test Point Selection Method Using Graph Neural Networks and Deep Reinforcement Learning

Shaoqi Wei(Ehime Univ.),  Kohei Shiotani(Ehime Univ.),  Senling Wang(Ehime Univ.),  Hiroshi Kai(Ehime Univ.),  Yoshinobu Higami(Ehime Univ.),  Hiroshi Takahashi(Ehime Univ.),  

[Date]2023-02-28
[Paper #]DC2022-87
Locating Hotspots in a Logic Circuit and Evaluation of Hotspots Caused by an Arbitrary Test Vector

Taiki Utsunomiya(Kyutech),  Kohei Miyase(Kyutech),  Shyue-Kung Lu(NTUST),  Xiaoqing Wen(Kyutech),  Seiji Kajihara(Kyutech),  

[Date]2023-02-28
[Paper #]DC2022-92
レイアウト起因LSI欠陥検出のためのFSGANを用いたデータ拡張に関する検討

Takumi Sugioka(Tokyo Metropolitan Univ.),  Yoshikazu Nagamura(Tokyo Metropolitan Univ.),  Masayuki Arai(Nihon Univ.),  Satoshi Fukumoto(Tokyo Metropolitan Univ.),  

[Date]2023-02-28
[Paper #]DC2022-82
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability

Ruijun Ma(AUST),  Stefan Holst(KIT),  Xiaoqing Wen(KIT),  Hui Xu(AUST),  Aibin Yan(AU),  

[Date]2023-02-28
[Paper #]DC2022-91