Information and Systems-Dependable Computing(Date:2010/02/08)

Presentation
表紙

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[Date]2010/2/8
[Paper #]
目次

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[Date]2010/2/8
[Paper #]
A Statistical Method of Small Iddq Variance Outlier Detection

Yoshiyuki NAKAMURA,  Masashi TANAKA,  

[Date]2010/2/8
[Paper #]DC2009-65
Test Pattern Re-Ordering for Thermal-Uniformity during Test

Makoto NAKAO,  Tomokazu YONEDA,  Michiko INOUE,  Hideo FUJIWARA,  

[Date]2010/2/8
[Paper #]DC2009-66
Study on a Test Generation Method for Transition Fault Using Multi Cycle Capture Test

Hiroshi OGAWA,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  Kouji YAMAZAKI,  

[Date]2010/2/8
[Paper #]DC2009-67
Modeling resistive open faults and generating their tests

Hiroshi TAKAHASHI,  Yoshinobu HIGAMI,  Yuta SHUDO,  Yuji TAKAMUNE,  Yuzo TAKAMATSU,  Toshiyuki TSUTSUMI,  Kouji YAMAZAKI,  Hiroyuki YOTSUYANAGI,  Masaki HASHIZUME,  

[Date]2010/2/8
[Paper #]DC2009-68
A Method of Reproducing Input/Output Error Trace on High-level Design for Hardware Debug Support

Yeonbok LEE,  Tasuku NISHIHARA,  Takeshi MATSUMOTO,  Masahiro FUJITA,  

[Date]2010/2/8
[Paper #]DC2009-69
A binding method for testability based on resources sequential depth reduction

Takaaki CHO,  Toshinori HOSOKAWA,  

[Date]2010/2/8
[Paper #]DC2009-70
Reduction of execution times and areas for delay measurement by subtraction

Toru TANABE,  Hirohisa MINATO,  Kentaroh KATOH,  Kazuteru NAMBA,  Hideo ITO,  

[Date]2010/2/8
[Paper #]DC2009-71
A Test Compaction Oriented Control Point Insertion Method for Transition Faults

Yoshitaka YUMOTO,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  

[Date]2010/2/8
[Paper #]DC2009-72
On Calculation of Delay Test Quality for Test Cubes and X-filling

Shinji OKU,  Seiji KAJIHARA,  Yasuo SATO,  Kohei MIYASE,  Xiaoqing WEN,  

[Date]2010/2/8
[Paper #]DC2009-73
Seed Selection for High Quality Delay Fault Test in BIST

Akira TAKETANI,  Tomokazu YONEDA,  Michiko INOUE,  Hideo FUJIWARA,  

[Date]2010/2/8
[Paper #]DC2009-74
A Study on Fault Acceptability in Digital Filters

Takumi MIYAGUCHI,  Yuki YOSHIKAWA,  Hideyuki ICHIHARA,  Tomoo INOUE,  

[Date]2010/2/8
[Paper #]DC2009-75
High Speed X-Fault Diagnosis with Partial X-Resolution

Kohei Miyase,  Yusuke Nakamura,  Yuta Yamato,  Xiaoqing Wen,  Seiji Kajihara,  

[Date]2010/2/8
[Paper #]DC2009-76
Consideration of Open Faults Model Based on Digital Measurement of TEG Chip

Toshiyuki TSUTSUMI,  Yasuyuki KARIYA,  Koji YAMAZAKI,  Masaki HASHIZUME,  Hiroyuki YOTSUYANAGI,  Hiroshi TAKAHASHI,  Yoshinobu HIGAMI,  Yuzo TAKAMATSU,  

[Date]2010/2/8
[Paper #]DC2009-77
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