Information and Systems-Dependable Computing(Date:2009/02/09)

Presentation
表紙

,  

[Date]2009/2/9
[Paper #]
目次

,  

[Date]2009/2/9
[Paper #]
On the Acceleration of Threshold Test Generation Based on Fault Acceptability

Yusuke NAKASHIMA,  Yuki YOSHIKAWA,  Hideyuki ICHIHARA,  Tomoo INOUE,  

[Date]2009/2/9
[Paper #]DC2008-68
A test pattern generation method to reduce the number of detected untestable faults on scan testing

Masayoshi YOSHIMURA,  Hiroshi OGAWA,  Yusho OMORI,  Toshinori HOSOKAWA,  Kouji YAMAZAKI,  

[Date]2009/2/9
[Paper #]DC2008-69
On the Acceleration of Redundancy Identification for Hard-to-ATPG faults Using SAT

Yusuke AKIYAMA,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  Kouji YAMAZAKI,  

[Date]2009/2/9
[Paper #]DC2008-70
Decimal adder using abacus architecture and its application to residue arithmetic

Tadahito IIJIMA,  Shugang WEI,  

[Date]2009/2/9
[Paper #]DC2008-71
History based scheduling for reliable Volunteer Computing

Ryo FUJITA,  Kan WATANABE,  Masaru FUKUSHI,  Susumu HORIGUCHI,  

[Date]2009/2/9
[Paper #]DC2008-72
A method for generating defect oriented test patterns for combinatorial circuit

Hiroshi TAKAHASHI,  Yoshinobu HIGAMI,  Taisuke IZUMI,  Takashi AIKYO,  Yuzo TAKAMATSU,  

[Date]2009/2/9
[Paper #]DC2008-73
On Tests to Detect Open faults with Considering Adjacent Lines

Tetsuya WATANABE,  Hiroshi TAKAHASHI,  Yoshinobu HIGAMI,  Toshiyuki TSUTUSMI,  Kouji YAMAZAKI,  Hiroyuki YOTSUYANAGI,  Masaki HASHIZUME,  Yuzo TAKAMATSU,  

[Date]2009/2/9
[Paper #]DC2008-74
Note on Small Delay Fault Model for Intra-Gate Resistive Open Defects

Masayuki Arai,  Akifumi Suto,  Kazuhiko Iwasaki,  Katsuyuki Nakano,  Michihiro Shintani,  Kazumi Hatayama,  Takashi Aikyo,  

[Date]2009/2/9
[Paper #]DC2008-75
A Method to Increase the Number of Don't care based on Easy-To-Detected Faults : Application for BAST Architecture

LingLing WAN,  Motohiro WAKAZONO,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  

[Date]2009/2/9
[Paper #]DC2008-76
Resource Binding to Minimize the Number of RTL Paths

Yuichi UEMOTO,  Satoshi OHTAKE,  Michiko INOUE,  Hideo FUJIWARA,  

[Date]2009/2/9
[Paper #]DC2008-77
A Secure Scan Design Approach Using Extended de Bruijn Graph

Hideo FUJIWARA,  Marie Engelene J. OBIEN,  

[Date]2009/2/9
[Paper #]DC2008-78
複写される方へ

,  

[Date]2009/2/9
[Paper #]
Notice for Photocopying

,  

[Date]2009/2/9
[Paper #]
奥付

,  

[Date]2009/2/9
[Paper #]