Information and Systems-Dependable Computing(Date:2007/02/02)

Presentation
表紙

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[Date]2007/2/2
[Paper #]
目次

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[Date]2007/2/2
[Paper #]
NoC Wrapper Optimization under Channel Bandwidth and Test Time Constraints

Fawnizu Azmadi HUSSIN,  Tomokazu YONEDA,  Hideo FUJIWARA,  

[Date]2007/2/2
[Paper #]DC2006-80
Improving Availability on a Muti-server Operating System

Ryota OZAKI,  Soichiro HIDAKA,  Kazuya KODAMA,  Katsumi MARUYAMA,  

[Date]2007/2/2
[Paper #]DC2006-81
Efficiency of compiled-code method in fault simulation for sequential circuits

Hideo FUJII,  Kenjiro Taniguchi,  Seiji KAJIHARA,  Xiaoqing WEN,  

[Date]2007/2/2
[Paper #]DC2006-82
A Study on Test Generation for Fault Diagnosis Based on Justification Path

Yasumitsu TAMOTO,  Koji YAMAZAKI,  Toshinori HOSOKAWA,  

[Date]2007/2/2
[Paper #]DC2006-83
On generation of high-quality test patterns for transition faults

Shohei MORISHIMA,  Masahiro YAMAMOTO,  Seiji KAJIHARA,  Xiaoqing WEN,  Masayasu FUKUNAGA,  Kazumi HATAYAMA,  Takashi AIKYO,  

[Date]2007/2/2
[Paper #]DC2006-84
Test Generation for Transistor Shorts based on Gate-level

Yoshinobu HIGAMI,  KewalK Saluja,  Hiroshi TAKAHASHI,  Shin-ya KOBAYASHI,  Yuzo TAKAMATSU,  

[Date]2007/2/2
[Paper #]DC2006-85
Analysis of Effective Decision Nodes on Test Generation

Yusho OMORI,  Toshinori HOSOKAWA,  Masayoshi YOSHIMURA,  Kouji YAMAZAKI,  

[Date]2007/2/2
[Paper #]DC2006-86
Reduction in Over-Testing of Delay Faults through False Paths Identification Using RTL Information

Yuki YOSHIKAWA,  Satoshi OHTAKE,  Hideo FUJIWARA,  

[Date]2007/2/2
[Paper #]DC2006-87
An Extended Class of Sequential Circuits with Acyclical Testability

Nobuya OKA,  ChiaYee OOI,  Hideyuki ICHIHARA,  Tomoo INOUE,  Hideo FUJIWARA,  

[Date]2007/2/2
[Paper #]DC2006-88
Implementation of a Double Clock Pulse Method and Evaluation of Tolerance for Process Variations

Yukiya MIURA,  

[Date]2007/2/2
[Paper #]DC2006-89
Fault Diagnosis of Analog Circuit by Adaptive Test of Digital Circuit

Jiro KATO,  Yukiya MIURA,  

[Date]2007/2/2
[Paper #]DC2006-90
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[Date]2007/2/2
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[Date]2007/2/2
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