Information and Systems-Dependable Computing(Date:2003/02/14)

Presentation
表紙

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[Date]2003/2/14
[Paper #]
目次

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[Date]2003/2/14
[Paper #]
Fault Diagnosis Based on Ambiguous Test Set Under BIST

Hiroshi TAKAHASHI,  Yasunori TUGAOKA,  Hidekazu AYANO,  Yuzo TAKAMATSU,  

[Date]2003/2/14
[Paper #]DC2002-79
Study on the Relation between Test Escape and Total Fault Coverage

Hiroki WADA,  Michinobu NAKAO,  Tadasu OTSUBO,  Makoto OTANI,  Kazumi HATAYAMA,  Yoshio TAKAMINE,  

[Date]2003/2/14
[Paper #]DC2002-79
Analysis Method of Analog Circuits by an Operation-Region Model

Daisuke KATO,  Yukiya MIURA,  

[Date]2003/2/14
[Paper #]DC2002-81
Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability

Tetsuo UCHIYAMA,  Tomokazu YONEDA,  Hideo FUJIWARA,  

[Date]2003/2/14
[Paper #]DC2002-82
Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits

Denduang PRADUBSUWUN,  Tomohiro YONEDA,  

[Date]2003/2/14
[Paper #]DC2002-83
A DFT method for RTL data paths based on strong testability to reduce test application time

Shintaro NAGAI,  Satoshi OHTAKE,  Hideo FUJIWARA,  

[Date]2003/2/14
[Paper #]DC2002-84
Estimation of Fault Coverage in Path Delay Fault Testing

Masayasu Fukunaga,  Koji Ishida,  Seiji Kajihara,  Sadami Takeoka,  

[Date]2003/2/14
[Paper #]DC2002-85
An Evaluation Method for Network Systems based on Delay-Jitter Analysis

Koutarou KUMAGAI,  Masahiro TSUNOYAMA,  Hiroei IMAI,  Ikuo ISHI,  

[Date]2003/2/14
[Paper #]DC2002-86
MD-SCAN Method for Low Power Scan Testing

Takaki Yoshida,  Masafumi Watari,  

[Date]2003/2/14
[Paper #]DC2002-87
Application of Partially Rotational Scan Technique to Tester IP

Kenichi Ichino,  Kohichi Watanabe,  Yuki Yamagata,  Masayuki Arai,  Satoshi Fukumoto,  Kazuhiko Iwasaki,  

[Date]2003/2/14
[Paper #]DC2002-88
A minimum feedback node set in a trivalent Cayley graph

Yasuto SUZUKI,  Keiichi KANEKO,  

[Date]2003/2/14
[Paper #]DC2002-89
A Test Compression for Test Application Based on Huffman Coding

Toshihiro OHARA,  Michihiro SHINTANI,  Hideyuki ICHIHARA,  Tomoo INOUE,  Akio TAMURA,  

[Date]2003/2/14
[Paper #]DC2002-90
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[Date]2003/2/14
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[Date]2003/2/14
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