Engineering Sciences/NOLTA-Ultrasonics(Date:2001/06/13)

Presentation
表紙

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[Date]2001/6/13
[Paper #]
目次

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[Date]2001/6/13
[Paper #]
Resonance Frequency Control of a Piezoelectric Device using Generalized Impedance Converter Circuit

Yoshikazu Koike,  Seji Kaneko,  

[Date]2001/6/13
[Paper #]US2001-13
Temperature Compensation Factor and Deviation Factor of Simple Ultrasonic Solution-Concentration Sensor

Kiyoshi Ikeda,  

[Date]2001/6/13
[Paper #]US2001-14
High Temperature Stable Surface Acoustic Wave Substrate of SiO_2/LiNbO_3 Structure with Super High Coupling

Kazuhiko Yamanouchi,  

[Date]2001/6/13
[Paper #]US2001-15
Investigation of quartz crystal slicing process controlled by new ultraviolet adhesive bonding

Takaya Watanabe,  Masayasu Kojima,  Kuniaki Yamato,  Mitsuro Kitano,  

[Date]2001/6/13
[Paper #]US2001-16
Sonic Crystal Waveguide : Numerical Simulations and Experiments

Toyokatsu Miyashita,  Chiryu Inoue,  

[Date]2001/6/13
[Paper #]US2001-17
Hearing of bone-conducted ultrasound and inner head acoustic sound field

Takefumi Sakaguchi,  Takahito Hirano,  Yoshiaki Watanabe,  Tadashi Nishimura,  Hiroshi Hosoi,  Satoshi Imaizumi,  Seiji Nakagawa,  Mitsuo Tonoike,  

[Date]2001/6/13
[Paper #]US2001-18
Numerical calculation and measurement of nonlinear sound field for ultrasonic diagnosis

Tetsuya Kawagishi,  Shigemi Saito,  Yoshitaka Mine,  

[Date]2001/6/13
[Paper #]US2001-19
Evaluation of proton-exchanged and annealed layers in LiTaO_3 optoelectronic devices by line-focus-beam ultrasonic material characterization system

Masahito Miyashita,  Jun-ichi Kushibiki,  

[Date]2001/6/13
[Paper #]US2001-20
Vibration imaging of tile/concrete structure by laser impact method

Tomokazu WATANABE,  Kenichi AIDU,  Teruyuki NAKAZAWA,  Hideo CHO,  Kazushi YAMANAKA,  

[Date]2001/6/13
[Paper #]US2001-21
Imaging of resonance frequency and Q factor distribution by ultrasonic atomic force microscopy

Toshihiro TSUJI,  Hiroshi IRIHAMA,  Yoshiki MARUYAMA,  Keiichi NAKAMOTO,  Kazushi YAMANAKA,  

[Date]2001/6/13
[Paper #]US2001-22
Nondestructive evaluation of SiC layer by Brillouin scattering method

Satoshi Murata,  Mami Matsukawa,  Takahiko Otani,  Takashi Matsumoto,  Masato Kiuchi,  

[Date]2001/6/13
[Paper #]US2001-23
[OTHERS]

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[Date]2001/6/13
[Paper #]