Engineering Sciences/NOLTA-Reliability(Date:2019/12/05)

Presentation
A study on iterative decoding using information of magnetic transitions in SMR

Madoka Nishikawa(Ehime Univ.),  Yasuaki Nakamura(Ehime Univ.),  Yasushi Kanai(NIIT),  Hisashi Osawa(Ehime Univ.),  Yoshihiro Okamoto(Ehime Univ.),  

[Date]2019-12-05
[Paper #]MRIS2019-39
A study on MAMR R/W channel modeling for signal processing

Yuji Yamada(Ehime Univ.),  Yasuaki Nakamura(Ehime Univ.),  Madoka Nishikawa(Ehime Univ.),  Yasushi Kanai(Niigata Institute of Technology),  Yoshihiro Okamoto(Ehime Univ.),  

[Date]2019-12-05
[Paper #]MRIS2019-40
Micromagnetic analysis of MAMR recording head

Ryo Itagaki(NIIT),  Yasushi Kanai(NIIT),  Simon Greaves(Tohoku Univ.),  

[Date]2019-12-05
[Paper #]MRIS2019-41
Comparative study of equalization techniques in holographic data storage

Shinya Kurokawa(Kindai Univ.),  Shuhei Yoshida(Kindai Univ.),  

[Date]2019-12-05
[Paper #]MRIS2019-42
Fabrication and properties of multi-layered recording media for magnetic hologram memory

Yuichi Nakamura(Toyohashi Tech.),  Taichi Goto(Toyohashi Tech.),  Lim Pang Beoy(Toyohashi Tech.),  Hironaga Uchida(Toyohashi Tech.),  Mitsuteru Inoue(Toyohashi Tech.),  

[Date]2019-12-05
[Paper #]MRIS2019-43
[Invited Talk] Data Storage System and Memory Devices Perspective

Naoki Kodama(YU),  Nobuyuki Inaba(YU),  Osamu Kitakami(Tohoku Univ),  

[Date]2019-12-05
[Paper #]
Information Stability in Heat-Assisted Magnetic Recording

Tadashi Kobayashi(Mie Univ.),  Yoshinobu Nakatani(UEC),  Yuji Fujiwara(Mie Univ.),  

[Date]2019-12-06
[Paper #]MRIS2019-44
Influence of magnetostriction on magnetic relaxation of FeCo single crystal thin films prepared at various substrate temperatures

Tomohiro Aranami(Yamagata Univ.),  Hiroyuki Hanazima(Yamagata Univ.),  Humiyosi Kirino(TUA),  Yutaka Takahasi(Yamagata Univ.),  Nobuyuki Inaba(Yamagata Univ.),  

[Date]2019-12-06
[Paper #]
Observation of residual stress during film growth of magnetic thin films

Shigeki Nakagawa(Tokyo Tech),  Hisanori Hayashibara(Tokyo Tech),  Masanari Nakagomi(Tokyo Tech),  Yoshimasa Ogawa(Tokyo Tech),  Yota Takamura(Tokyo Tech),  

[Date]2019-12-06
[Paper #]MRIS2019-45