Presentation | |
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Takeshi Kawamoto(Mitsubishi Electric), Akinori Nakajima(Mitsubishi Electric), Masatsugu Higashinaka(Mitsubishi Electric), Hiroyasu Sano(Mitsubishi Electric), Atsushi Okamura(Mitsubishi Electric), [Date]2018-01-22[Paper #]IT2017-66,SIP2017-74,RCS2017-280 | |
Tomoyuki Seito(CIT), Makoto Nakashizuka(CIT), [Date]2018-01-22[Paper #]IT2017-71,SIP2017-79,RCS2017-285 | |
Hikaru Mizuyoshi(UEC), Terumasa Sato(UEC), Chenggao HAN(UEC), [Date]2018-01-22[Paper #]IT2017-70,SIP2017-78,RCS2017-284 | |
Keita Ito(NITech), Eiji Okamoto(NITech), Hideki Takenaka(NICT), Hiroo Kunimori(NICT), Morio Toyoshima(NICT), [Date]2018-01-22[Paper #]IT2017-68,SIP2017-76,RCS2017-282 | |
Kyouka Abe(Grad. Sch. TUSS), Syouta Wakabayashi(TUSS), Naoki Ginoza(Grad. Sch. TUSS), Kazuhiro Yamaguchi(TUSS), Hideaki Matsue(TUSS), [Date]2018-01-22[Paper #]IT2017-78,SIP2017-86,RCS2017-292 | |
Yoshiyuki Tanaka(Tokyo University of Science, Suwa), Mitsumasa Saitou(CQ-S net), Hideaki Matsue(Tokyo University of Science, Suwa), [Date]2018-01-22[Paper #]IT2017-80,SIP2017-88,RCS2017-294 | |
Takahiro Fujikawa(TUS), Ryousuke Kunii(TUS), Takashi Yoshida(TUS), Naoyuki Aikawa(TUS), [Date]2018-01-22[Paper #]IT2017-72,SIP2017-80,RCS2017-286 | |
Takumi Takahashi(Osaka Univ.), Shinsuke Ibi(Osaka Univ.), Seiichi Sampei(Osaka Univ.), [Date]2018-01-22[Paper #]IT2017-59,SIP2017-67,RCS2017-273 | |
Tetsuya Kojima(NIT, Tokyo College), [Date]2018-01-22[Paper #]IT2017-62,SIP2017-70,RCS2017-276 | |
Bohulu Kwame Ackah(UEC), Chenggao Han(UEC), [Date]2018-01-22[Paper #]IT2017-69,SIP2017-77,RCS2017-283 | |
Naoki Sakai(Osaka Univ.), Shinsuke Ibi(Osaka Univ.), Seiichi Sampei(Osaka Univ.), [Date]2018-01-22[Paper #]IT2017-82,SIP2017-90,RCS2017-296 | |
Tatsuki Okuyama(NTT DOCOMO), Satoshi Suyama(NTT DOCOMO), Jun Mashino(NTT DOCOMO), Yukihiko Okumura(NTT DOCOMO), [Date]2018-01-22[Paper #]IT2017-58,SIP2017-66,RCS2017-272 | |
Hiroyuki Torii(Osaka Univ.), Shinsuke Ibi(Osaka Univ.), Seiich Sampei(Osaka Univ.), [Date]2018-01-22[Paper #]IT2017-81,SIP2017-89,RCS2017-295 | |
Atsushi Ohta(NTT), Ken Tanaka(NTT), Kazuto Goto(NTT), Naoki Kita(NTT), [Date]2018-01-22[Paper #]IT2017-79,SIP2017-87,RCS2017-293 | |
Eiji Okamoto(NITech), Naoto Horiike(NITech), Tetsuya Yamamoto(Panasonic), [Date]2018-01-22[Paper #]IT2017-57,SIP2017-65,RCS2017-271 | |
Bin Zheng(Tokyo City Univ.), Mamoru Sawahashi(Tokyo City Univ.), Norifumi Kamiya(NEC), [Date]2018-01-22[Paper #]IT2017-64,SIP2017-72,RCS2017-278 | |
Takaya Yamazato(Nagoya Univ.), Yukihiro Tadokoro(Toyota Central R&D Labs.,), Hiroya Tanaka(Toyota Central R&D Labs.,), Hiroya Tanaka(Nagoya Univ.), Shintaro Arai(Okayama Univ of Science), Yasuo Nakashima(Nagoya Univ.), Shintaro Hiraoka(Nagoya Univ.), [Date]2018-01-22[Paper #]IT2017-83,SIP2017-91,RCS2017-297 | |
Naoto Horiike(NITech), Eiji Okamoto(NITech), Tetsuya Yamamoto(Panasonic), [Date]2018-01-22[Paper #]IT2017-77,SIP2017-85,RCS2017-291 | |
Aya Shimura(Tokyo City Univ.), Mamoru Sawahashi(Tokyo City Univ.), Satoshi Nagata(NTT DOCOMO), Yoshihisa Kishiyama(NTT DOCOMO), [Date]2018-01-22[Paper #]IT2017-63,SIP2017-71,RCS2017-277 | |
Ryo Hayakawa(Kyoto Univ.), Ayano Nakai(Kyoto Univ.), Kazunori Hayashi(Osaka City Univ.), [Date]2018-01-22[Paper #]IT2017-74,SIP2017-82,RCS2017-288 |