Engineering Sciences/NOLTA-Reliability(Date:2003/08/28)

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[Date]2003/8/28
[Paper #]
目次

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[Date]2003/8/28
[Paper #]
Calculating Exact Top-Event Probabilities of Fault-Tree by Using Domination

Kazuhiro Tagami,  Tetsushi Yuge,  Shigeru Yanagi,  

[Date]2003/8/28
[Paper #]R2003-28,ED2003-106
State-Transition Diagram of Safety-Related Systems without Self-diagnosis

Tsuneharu SHIMODAIRA,  Yoshinobu SATO,  Koichi SUYAMA,  

[Date]2003/8/28
[Paper #]R2003-29,ED2003-107
Probability of Failure on Demand for Safety-Related Systems

Isamu TAKEDA,  Tsuneharu SHIMODAIRA,  Koichi SUYAMA,  Yoshinobu SATO,  

[Date]2003/8/28
[Paper #]R2003-30,ED2003-108
An Optimal Inspection Policy for a Markovian Deteriorating Model with Repair and Replacement

Nobuyuki TAMURA,  

[Date]2003/8/28
[Paper #]R2003-31,ED2003-109
System Reliability Architecture and Its Modeling of Commercial Service

Akihiko MASUDA,  

[Date]2003/8/28
[Paper #]R2003-32,ED2003-110
Estimating Periodic Software Rejuvenation Schedule under Discrete-Time Operation Circumstance

Kazuki IWAMOTO,  Tadashi DOHI,  Naoto KAIO,  

[Date]2003/8/28
[Paper #]R2003-33,ED2003-111
Estimating Software Reliability in the Dynamic Capture-Recapture Method

Hiroyuki OKAMURA,  Takayasu MURAKAMI,  Tadashi DOHI,  

[Date]2003/8/28
[Paper #]R2003-34,ED2003-112
Reliability and Degradation Mechanism of Optical Devices : Control of Crystalinity/Interface and Device Reliability

Osamu UEDA,  

[Date]2003/8/28
[Paper #]R2003-35,ED2003-113
BIAS ACCELERATION OF DRAIN RESISTANCE INCREASE IN INP-BASED HEMTS AND RELIABILITY STUDY OF HEMT-ICs

Yoshino K. Fukai,  Suehiro Sugitani,  Takatomo Enoki,  Hiroto Kitabayashi,  Koichi Murata,  Takashi Makimura,  Yasuro Yamane,  Masahiro Muraguchi,  

[Date]2003/8/28
[Paper #]R2003-36,ED2003-114
Reliability on InGaAs/InP HBTs with InP Passivation Structure

Ryuji YAMABI,  Kenji KOTANI,  Takeshi KAWASAKI,  Masaki YANAGISAWA,  Seiji YAEGASSI,  Hiroshi YANO,  

[Date]2003/8/28
[Paper #]R2003-37,ED2003-115
Degradation mechanism of AlGaAs/InGaAs PHEMT under large signal operation : Surface degradation under high electric field

Takayuki HISAKA,  Yoichi NOGAMI,  Hajime SASAKI,  Atushi HASUIKE,  Naohito YOSHIDA,  Kazuo HAYASHI,  

[Date]2003/8/28
[Paper #]R2003-38,ED2003-116
Ohmic Contact Mechanism of Al-Mo Alloy Electrode to n-InP Substrate

Mayumi B. TAKEYAMA,  Atsushi NOYA,  Tamotsu HASHIZUME,  Hideki HASEGAWA,  

[Date]2003/8/28
[Paper #]R2003-39,ED2003-117
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[Date]2003/8/28
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[Date]2003/8/28
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