Engineering Sciences/NOLTA-Reliability(Date:1997/11/07)

Presentation
表紙

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[Date]1997/11/7
[Paper #]
目次

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[Date]1997/11/7
[Paper #]
Failure Rate Model of MIL-HDBK-217F

Hisashi MINE,  

[Date]1997/11/7
[Paper #]R97-15
An Example of Developing Accelerated Test of Combined stresses

Nobutoyo Tsutsumi,  

[Date]1997/11/7
[Paper #]R97-16
Algorithms for Predicting Lifetimes with Fuzzy Reasoning

Takeshi KOYAMA,  

[Date]1997/11/7
[Paper #]R97-17
On the survey of electromagnetic wave environment on board

Akio Funae,  Takeshi Hashimoto,  Kojiro Yoshida,  Kenji Yamane,  Kazuo Hitomi,  

[Date]1997/11/7
[Paper #]R97-18
Development of Evaluation Method by Impact Contacts

Ryuichi Nakajima,  Yasuo Imai,  

[Date]1997/11/7
[Paper #]R97-19
Effects of test structure on the lifetime estimation of via hole

S. Yamamoto,  J. Komori,  Y. Takata,  M. Sekine,  H. Koyama,  

[Date]1997/11/7
[Paper #]R97-20
Degradation Caused by Reverse Biased Current in PN Junction

I. Minekawa,  

[Date]1997/11/7
[Paper #]R97-21
Backside Emission Microscopy in a LSI Chip

Tatsuya Ishii,  Kensaku Naitoh,  Jun-ichi Mitsuhashi,  

[Date]1997/11/7
[Paper #]R97-22
[OTHERS]

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[Date]1997/11/7
[Paper #]