Engineering Sciences/NOLTA-Reliability(Date:1997/06/20)

Presentation
表紙

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[Date]1997/6/20
[Paper #]
目次

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[Date]1997/6/20
[Paper #]
Recent Trend of Reliability Study for Semiconductor Devices Technology : A Report on the 35th IRPS

Masakazu Shimaya,  

[Date]1997/6/20
[Paper #]R97-1
Evaluation of TDDB Lifetime of the gate oxide in the 100k-gate CMOS gate-array

Shinichi Shugyo,  Kazuhiro Matsuzaki,  Norio Nemoto,  Sumio Matsuda,  

[Date]1997/6/20
[Paper #]R97-2
Device Degradation Due to Stud Bumping Above the MOSFETs and its Elimination Behavior by Annealing

N Shimoyama,  K Machida,  M Shimaya,  H Akiya,  H Kyuragi,  

[Date]1997/6/20
[Paper #]R97-3
The Characteristics of Preventive Maintenance in the System with Weibull Distribution

Yoshihito Takahashi,  Michio Horigome,  

[Date]1997/6/20
[Paper #]R97-4
[OTHERS]

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[Date]1997/6/20
[Paper #]