Engineering Sciences/NOLTA-Reliability(Date:1996/11/08)

Presentation
表紙

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[Date]1996/11/8
[Paper #]
目次

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[Date]1996/11/8
[Paper #]
Efficient Reliability Test and Lifetime-Prediction

Takeshi KOYAMA,  

[Date]1996/11/8
[Paper #]R96-19
Mechanism of increase contact resistance by materials and environment

Yutaka Takenaka,  

[Date]1996/11/8
[Paper #]R96-20
Reliability Estimation of AlGaInP-based Pin-point LED

Hiroshi IMAMOTO,  Masashi YANAGASE,  Motoaki TAKAOKA,  

[Date]1996/11/8
[Paper #]R96-21
Reliability of Silicon Devices on Power Modules

Shinji NAKAMURA,  Masao HIRANO,  

[Date]1996/11/8
[Paper #]R96-22
Classification of Soldering Heat Methods in view of Temperature in Surface Mount LSIs

Koji Okada,  Takao Syouji,  Masaki Tanaka,  

[Date]1996/11/8
[Paper #]R96-23
Detailed Investigation of AC Hot-Carrier Lifetime by Ring Oscillator

Shinji Nakano,  Masahiro Fujimoto,  Takeshi Suzuki,  Tetsuaki Wada,  

[Date]1996/11/8
[Paper #]R96-24
Study of relation between Constant Voltage TDDB and Constant Current TDDB

Masahiro Fujimoto,  Shinji Nakano,  Tetsuaki Wada,  

[Date]1996/11/8
[Paper #]R96-25
[OTHERS]

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[Date]1996/11/8
[Paper #]