Engineering Sciences/NOLTA-Reliability(Date:1994/11/18)

Presentation
表紙

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[Date]1994/11/18
[Paper #]
目次

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[Date]1994/11/18
[Paper #]
Effects of Organic Gas Components on Contact Resistance

Yutaka Takenaka,  Kenji Funaki,  Shingo Shimada,  

[Date]1994/11/18
[Paper #]R94-37
Prediction for failure-rate of the thin diode for space application

Yasunori Uchida,  Kunio Kamimura,  Keiji Shimada,  

[Date]1994/11/18
[Paper #]R94-38
Study on Surface Mount Technology of Fine Pitch Package and Other Devices.

Yasuo Tanaka,  Muneaki Nakai,  Akira Murakami,  

[Date]1994/11/18
[Paper #]R94-39
TDDB Study of Thin Silicon Nitride(SiN)Films for Capacitors

Ichiro Minekawa,  Tetsuaki Wada,  

[Date]1994/11/18
[Paper #]R94-40
Time-Dependent Dielectric Degradation(TDDD) in Ultrathin Silicon Dioxide Films

Mikihiro Kimura,  Youji Mashiko,  Junichi Mitsuhashi,  

[Date]1994/11/18
[Paper #]R94-41
Electromigration Lifetime of Interconection with Via

Shinji Nakano,  Tetsuaki Wada,  

[Date]1994/11/18
[Paper #]R94-42
Hot-Carrier Degradation under High Speed Ring Cscillator Operations in MOSFETs

Tomoyuki Morii,  Yukiharu Uraoka,  Kenzo Hatada,  

[Date]1994/11/18
[Paper #]R94-43
Phenomenor of time dependent degradation of p-n junction

Junichi Mitsuhashi,  Hajime Watabe,  Junko Komori,  

[Date]1994/11/18
[Paper #]R94-44
[OTHERS]

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[Date]1994/11/18
[Paper #]