Engineering Sciences/NOLTA-Reliability(Date:1993/11/19)

Presentation
表紙

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[Date]1993/11/19
[Paper #]
目次

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[Date]1993/11/19
[Paper #]
Activities on Environmental Preservation and Reliability Assurance

Yoshiharu Kiyota,  

[Date]1993/11/19
[Paper #]R93-37
Effects of Gas Emission Components on Contact Resistance : Effects of THF and 2,6-di-tert-butylphenol on Contact Resistance

Yutaka Takenaka,  Kenji Funaki,  Shingo Shimada,  Tetsuo Hayase,  

[Date]1993/11/19
[Paper #]R93-38
Soft-Error Study of DRAMs with Microprobe

Yoshikazu Ohno,  Hiroshi Kimura,  Tadashi Nishimura,  Hirokazu Sayama,  Shigenori Hara,  Mikio Takai,  

[Date]1993/11/19
[Paper #]R93-39
Reliability evaluation of thin gate oxide using a very low-current technique

Masafumi Katsumata,  Hiromitsu Sugimoto,  Seiki Kobayashi,  Junichi Mitsuhashi,  

[Date]1993/11/19
[Paper #]R93-40
Degradation Phenomenon under High Gate Voltage Stress in pMOSFETs

Tomoyuki Morii,  Ryoko Miyanaga,  Yukiharu Uraoka,  Kazuhiko Tsuji,  

[Date]1993/11/19
[Paper #]R93-41
Problem of High Accelerated Electromigration Test

Shinji Nakano,  Tetsuaki Wada,  

[Date]1993/11/19
[Paper #]R93-42
The Comparison with CDM Test Methods (CDM Method and SCV Method)

Nozomu Maeda,  Yoshiharu Kataoka,  Koichi Matsushita,  Tetsuaki Wada,  

[Date]1993/11/19
[Paper #]R93-43
[OTHERS]

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[Date]1993/11/19
[Paper #]