Presentation | |
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Tetsu Morooka(Kioxia), [Date]2022-08-08[Paper #]SDM2022-36,ICD2022-4 | |
Haruki Yonezaki(KIT), Jiro Ida(KIT), Takayuki Mori(KIT), Koichiro Ishibashi(UEC), [Date]2022-08-08[Paper #]SDM2022-38,ICD2022-6 | |
Koichiro Zaitsu(Sony Semiconductor Solutions), Akira Matsumoto(Sony Semiconductor Solutions), Mizuki Nishida(Sony Semiconductor Solutions), Yusuke Tanaka(Sony Semiconductor Solutions), Hirofumi Yamashita(Sony Semiconductor Solutions), Yosuke Satake(Sony Semiconductor Solutions), Takashi Watanabe(Sony Semiconductor Manufacturing), Kunihiko Araki(Sony Semiconductor Manufacturing), Naoki Nei(Sony Semiconductor Manufacturing), Keiichi Nakazawa(Sony Semiconductor Solutions), Junpei Yamamoto(Sony Semiconductor Solutions), Mutsuo Uehara(Sony Semiconductor Solutions), Hiroyuki Kawashima(Sony Semiconductor Manufacturing), Yusaku Kobayashi(Sony Semiconductor Manufacturing), Tomoyuki Hirano(Sony Semiconductor Solutions), Keiji Tatani(Sony Semiconductor Solutions), [Date]2022-08-08[Paper #]SDM2022-33,ICD2022-1 | |
Naohiko Kimizuka(Sony Semiconductor Solutions), Shota Kitamura(Sony Semiconductor Solutions), Akiko Honjo(Sony Semiconductor Solutions), Koichi Baba(Sony Semiconductor Solutions), Toshihiro Kurobe(Sony Semiconductor Solutions), Hideomi Kumano(Sony Semiconductor Solutions), Takuya Toyohuku(Sony Semiconductor Solutions), Kouhei Takeuchi(Sony Semiconductor Manufacturing), Shota Nishimura(Sony Semiconductor Manufacturing), Akihiko Kato(Sony Semiconductor Solutions), Tomoyuki Hirano(Sony Semiconductor Solutions), Yusuke Oike(Sony Semiconductor Solutions), [Date]2022-08-08[Paper #]SDM2022-34,ICD2022-2 | |
Ryozo Takahashi(Kobe Univ.), Takuji Miki(Kobe Univ.), Makoto Nagata(Kobe Univ.), [Date]2022-08-08[Paper #]SDM2022-42,ICD2022-10 | |
Takuya Wadatsumi(Kobe Univ.), Kohei Kawai(Kobe Univ.), Rikuu Hasegawa(Kobe Univ.), Kikuo Muramatsu(e-SYNC), Hiromu Hasegawa(Megachips), Takuya Sawada(Megachips), Takahito Fukushima(Megachips), Hisashi Kondo(Megachips), Takuji Miki(Kobe Univ.), Makoto Nagata(Kobe Univ.), [Date]2022-08-08[Paper #]SDM2022-40,ICD2022-8 | |
Kosuke Hamaguchi(Meijo Univ.), Shu Takemoto(Meijo Univ.), Yusuke Nozaki(Meijo Univ.), Masaya Yoshikawa(Meijo Univ.), [Date]2022-08-08[Paper #]SDM2022-41,ICD2022-9 | |
Jiro Ida(Kanazawa IT), Takayuki Mori(Kanazawa IT), [Date]2022-08-08[Paper #]SDM2022-37,ICD2022-5 | |
Hikaru Sebe(Osaka Univ.), Daisuke Kanemoto(Osaka Univ.), Tetsuya Hirose(Osaka Univ.), [Date]2022-08-08[Paper #]SDM2022-39,ICD2022-7 | |
Zule Xu(UTokyo), Masaru Osada(UTokyo), Tetsuya Iizuka(UTokyo), [Date]2022-08-08[Paper #]SDM2022-43,ICD2022-11 | |
Yu Maehashi(Canon), Yasuharu Ota(Canon), Kazuhiro Morimoto(Canon), Tomoya Sasago(Canon), Mahito Shinohara(Canon), Yukihiro Kuroda(Canon), Wataru Endo(Canon), Shintaro Maekawa(Canon), Masanao Motoyama(Canon), Kenzo Tojima(Canon), Hiroyuki Tsuchiya(Canon), Ayman Abdelghafar(Canon), Kosei Uehira(Canon), Junji Iwata(Canon), Fumihiro Inui(Canon), Yasushi Matsuno(Canon), Katsuhito Sakurai(Canon), Takeshi Ichikawa(Canon), [Date]2022-08-08[Paper #]SDM2022-35,ICD2022-3 | |
Hidehiro Asai(AIST), Takumi Inaba(AIST), Junichi Hattori(AIST), Koichi Fukuda(AIST), Hiroshi Oka(AIST), Takahiro Mori(AIST), [Date]2022-08-09[Paper #]SDM2022-47,ICD2022-15 | |
Hiroshi Oka(AIST), Takumi Inaba(AIST), Shota Iizuka(AIST), Hidehiro Asai(AIST), Kimihiko Kato(AIST), Takahiro Mori(AIST), [Date]2022-08-09[Paper #]SDM2022-46,ICD2022-14 | |
Ippei Akita(AIST), Takeshi Kawano(Aichi Steel Corp.), Hitoshi Aoyama(Aichi Steel Corp.), Shunichi Tatematsu(Aichi Steel Corp.), Masakazu Hioki(AIST), [Date]2022-08-09[Paper #]SDM2022-44,ICD2022-12 | |
Keita Yasutomi(Shizuoka Univ.), Tatsuki Furuhashi(Shizuoka Univ.), Koki Sagawa(Shizuoka Univ.), Taishi Takasawa(Shizuoka Univ.), Keiichiro Kagawa(Shizuoka Univ.), Shoji Kawahito(Shizuoka Univ.), [Date]2022-08-09[Paper #]SDM2022-45,ICD2022-13 | |
Wang Ruizhi(The Univ. of Tokyo), Takamiya Makoto(The Univ. of Tokyo), [Date]2022-08-10[Paper #]SDM2022-53,ICD2022-21 | |
Zheng Li(Tokyo Tech), Jian Pang(Tokyo Tech), Yi Zhang(Tokyo Tech), Yudai Yamazaki(Tokyo Tech), Qiaoyu Wang(Tokyo Tech), Peng Luo(Tokyo Tech), Weichu Chen(Tokyo Tech), Yijing Liao(Tokyo Tech), Minzhe Tang(Tokyo Tech), Zhengyan Guo(Tokyo Tech), Yun Wang(Tokyo Tech), Xi Fu(Tokyo Tech), Dongwon You(Tokyo Tech), Naoki Oshima(NEC), Shinichi Hori(NEC), Kazuaki Kunihiro(NEC), Atsushi Shirane(Tokyo Tech), Kenichi Okada(Tokyo Tech), [Date]2022-08-10[Paper #]SDM2022-48,ICD2022-16 | |
Fukashi Morishita(Renesas Electronics), Norihito Kato(Renesas Electronics), Satoshi Okubo(Renesas Electronics), Takao Toi(Renesas Electronics), Mitsuru Hiraki(Renesas Electronics), Sugako Otani(Renesas Electronics), Hideaki Abe(Renesas Electronics), Yuji Shinohara(Renesas Electronics), Hiroyuki Kondo(Renesas Electronics), [Date]2022-08-10[Paper #]SDM2022-52,ICD2022-20 | |
Jian Pang(Tokyo Tech), Yi Zhang(Tokyo Tech), Zheng Li(Tokyo Tech), Minzhe Tang(Tokyo Tech), Yijing Liao(Tokyo Tech), Ashbir Aviat Fadila(Tokyo Tech), Atsushi Shirane(Tokyo Tech), Kenichi Okada(Tokyo Tech), [Date]2022-08-10[Paper #]SDM2022-49,ICD2022-17 | |
Masato Motomura(TokyoTech), [Date]2022-08-10[Paper #] |