Presentation | |
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Tetsuro Kinoshita(TOK), Shunichi Mashita(TOK), Takuya Ohashi(TOK), Yoshihiro Sawada(TOK), Yohei Kinoshita(TOK), Satoshi Fujimura(TOK), [Date]2017-10-25[Paper #]SDM2017-53 | |
Yasutaka Maeda(Tokyo Tech.), Yeyuan Liu(Tokyo Tech.), Mizuha Hiroki(Tokyo Tech.), Shun-ichiro Ohmi(Tokyo Tech.), [Date]2017-10-25[Paper #]SDM2017-54 | |
Tomoyasu Kakegawa(SanDisk), Takuya Futase(SanDisk), [Date]2017-10-25[Paper #]SDM2017-50 | |
Sohya Kudoh(Tokyo Tech.), Shun-ichiro Ohmi(Tokyo Tech.), [Date]2017-10-25[Paper #]SDM2017-52 | |
Hyeonwoo Park(Tohoku Univ), Rihito Kuroda(Tohoku Univ), Tetsuya Goto(Tohoku Univ), Tomoyuki Suwa(Tohoku Univ), Akinobu Teramoto(Tohoku Univ), Daiki Kimoto(Tohoku Univ), Shigetoshi Sugawa(Tohoku Univ), [Date]2017-10-25[Paper #]SDM2017-51 | |
Yotaro Goto(RSMC), Tadasihi Yamaguchi(REL), Masazumi Matsuura(REL), Koji Iizuka(RSMC), [Date]2017-10-26[Paper #]SDM2017-59 | |
Takahiro Shimoi(Renesas Electronics), Tomoya Saito(Renesas Electronics), Hirokazu Nagase(Renesas Electronics), Masayuki Izuna(Renesas Electronics), Akihiko Kanda(Renesas Electronics), Takashi Ito(Renesas Electronics), Takashi Kono(Renesas Electronics), [Date]2017-10-26[Paper #]SDM2017-58 | |
Takashi Onaya(Meiji Univ./NIMS), Toshihide Nabatame(NIMS/JST), Naomi Sawamoto(Meiji Univ.), Akihiko Ohi(NIMS), Naoki Ikeda(NIMS), Toyohiro Chikyow(NIMS), Atsushi Ogura(Meiji Univ.), [Date]2017-10-26[Paper #]SDM2017-57 | |
Hidekazu Ishii(Tohoku Univ.), Masaaki Nagase(Fujikin Inc.), Nobukazu Ikeda(Fujikin Inc.), Yoshinobu Shiba(Tohoku Univ.), Yasuyuki Shirai(Tohoku Univ.), Rihito Kuroda(Tohoku Univ.), Shigetoshi Sugawa(Tohoku Univ.), [Date]2017-10-26[Paper #]SDM2017-56 | |
Shinya Ichino(Tohoku Univ.), Takezo Mawaki(Tohoku Univ.), Akinobu Teramoto(Tohoku Univ.), Rihito Kuroda(Tohoku Univ.), Shunichi Wakashima(Tohoku Univ.), Shigetoshi Sugawa(Tohoku Univ.), [Date]2017-10-26[Paper #]SDM2017-60 | |
Hiroshi Akahori(Toshiba Memory), Kouta Nakata(Toshiba), Ryohei Orihara(Toshiba), Yoshiaki Mizuoka(Toshiba), Kentaro Takagi(Toshiba), Kenichi Kadota(Toshiba Memory), Takaharu Nishimura(Toshiba Memory), Yukako Tanaka(Toshiba Memory), Hidetaka Eguchi(Toshiba Memory), [Date]2017-10-26[Paper #]SDM2017-55 |