Presentation | |
---|---|
Masako Kodera(Toshiba), Hiroyuki Yano(Toshiba), Naoto Miyashita(Toshiba), [Date]2017-02-06[Paper #]SDM2016-139 | |
Toshio Kobayashi(SIT), [Date]2017-02-06[Paper #]SDM2016-142 | |
Osamu Nakatsuka(Grad. Sch. of Eng., Nagoya University), Yoshimasa Watanabe(TEL), Akihiro Suzuki(Grad. Sch. of Eng., Nagoya University), Yoshio Nishi(Dept. of Electrical Engineering, Stanford University), Shigeaki Zaima(IMaSS, Nagoya University), [Date]2017-02-06[Paper #]SDM2016-141 | |
Kotoku Inoue(Koto), Masatoshi Takayama(Koto), Tsubasa Fujimura(Koto), Shigeo Onitake(Koto), [Date]2017-02-06[Paper #]SDM2016-146 | |
Naoki Banno(NEC Corp.), Munehiro Tada(NEC Corp.), Koichiro Okamoto(NEC Corp.), Noriyuki Iguchi(NEC Corp.), Toshitsugu Sakamoto(NEC Corp.), Hiromitsu Hada(NEC Corp.), Hiroyuki Ochi(Ritsumeikan Univ.), Hidetoshi Onodera(Kyoto Univ.), Masanori Hashimoto(Osaka Univ.), Tadahiko Sugibayashi(NEC Corp.), [Date]2017-02-06[Paper #]SDM2016-144 | |
Junichi Hattori(AIST), Koichi Fukuda(AIST), Toshifumi Irisawa(AIST), Hiroyuki Ota(AIST), Tatsuro Maeda(AIST), [Date]2017-02-06[Paper #]SDM2016-143 | |
Naoya Watanabe(AIST), Hidekazu Kikuchi(LAPIS), Azusa Yanagisawa(LAPIS), Haruo Shimamoto(AIST), Katsuya Kikuchi(AIST), Masahiro Aoyagi(AIST), Akio Nakamura(LAPIS), [Date]2017-02-06[Paper #]SDM2016-145 | |
Yukihiro Shimogaki(UTokyo), [Date]2017-02-06[Paper #]SDM2016-140 | |
Maryamsadat Hosseini(Tohoku Univ.), Hiroyuki Koide(Tohoku Univ.), Kazuki Watanabe(Tohoku Univ.), Daisuke Ando(Tohoku Univ.), Yuji Sutou(Tohoku Univ.), Junichi Koike(Tohoku Univ.), [Date]2017-02-06[Paper #] |