Electronics-Microwaves(Date:2020/01/31)

Presentation
[Special Talk] Briefing Report on European Microwave Week 2019

Masatake Hangai(Mitsubishi Electric Co.),  Kenjiro Nishikawa(Kagoshima Univ.),  Kenji Mukai(Murata Manufacturing Co.),  Motomi Abe(Mitsubishi Electric Co.),  Yusuke Kitsukawa(Mitsubishi Electric Co.),  Ryota Komaru(Mitsubishi Electric Co.),  Shuichi Sakata(Mitsubishi Electric Co.),  Jun Kamioka(Mitsubishi Electric Co.),  Shinya Yokomizo(Mitsubishi Electric Co.),  

[Date]2020-01-31
[Paper #]ED2019-99,MW2019-133
Phase Synchronization Technique Between Fractional-N PLLs by Correcting Phase Error due to Cycle Slip using Reference Delta-Sigma Modulator

Sho Ikeda(MELCO),  Akihito Hirai(MELCO),  Koji Tsutsumi(MELCO),  Masaomi Tsuru(MELCO),  

[Date]2020-01-31
[Paper #]ED2019-93,MW2019-127
GaN-on-Diamond HEMTs fabricated by Surface-Activated Room-Temperature Bonding

Shuichi Hiza(Mitsubishi Electric),  Masahiro Fujikawa(Mitsubishi Elctric),  Yuki Takiguchi(Mitsubishi Electric),  Kunihiko Nishimura(Mitsubishi Electric),  Eiji Yagyu(Mitsubishi Electric),  Takashi Matsumae(AIST),  Yuichi Kurashima(AIST),  Hideki Takagi(AIST),  Mikio Yamamuka(Mitsubishi Electric),  

[Date]2020-01-31
[Paper #]ED2019-97,MW2019-131
Novel Sample Holder Structure for S11 Calibration via SOM and Related Application to Dielectric Measurement in Liquids via the Cut-off Waveguide Reflection Method

Kouji Shibata(Hachinohe Inst. of Tech.),  

[Date]2020-01-31
[Paper #]ED2019-95,MW2019-129
[Invited Talk] Research and development of compound semiconductor electron devices and high-frequency measurement technologies for millimeter- and submillimeter-wave wireless communications

Issei Watanabe(NICT),  Yoshimi Yamashita(NICT),  Akifumi Kasamatsu(NICT),  

[Date]2020-01-31
[Paper #]ED2019-105,MW2019-139
[Special Talk] Maximum Achievable Efficiency of Multiple-Input Multiple-Output Inductive Power Transfer Systems

Quang-Thang Duong(NAIST),  Minoru Okada(NAIST),  

[Date]2020-01-31
[Paper #]ED2019-102,MW2019-136
[Special Talk] An Accurate and Fast Permittivity Measurement System for Terahertz imaging

Teruo Jyo(NTT),  Hiroshi Hamada(NTT),  Hideaki Matsuzaki(NTT),  Hideyuki Nosaka(NTT),  

[Date]2020-01-31
[Paper #]ED2019-100,MW2019-134
[Special Talk] Scattering Suppression by a Near-Zero-Index Metamaterial of Periodic Dielectric Spheres

Yuma Takano(Osaka Univ.),  Atsushi Sanada(Osaka Univ.),  

[Date]2020-01-31
[Paper #]ED2019-101,MW2019-135
Basic study on triplexer using matching circuit consisted of lumped elements

Genki Oishi(NIT,Oyama College),  Shinpei Oshima(NIT,Oyama College),  

[Date]2020-01-31
[Paper #]ED2019-94,MW2019-128
Simple Photoelectrochemical Etching for Recess Gate GaN HEMT

Fumimasa Horikiri(SCIOCS),  Noboru Fukuhara(SCIOCS),  Masachika Toguchi(Hokaido Univ.),  Kazuki Miwa(Hokaido Univ.),  Yoshinobu Narita(SCIOCS),  Osamu Ichikawa(SCIOCS),  Ryota Isono(SCIOCS),  Takeshi Tanaka(SCIOCS),  Taketomo Sato(Hokaido Univ.),  

[Date]2020-01-31
[Paper #]ED2019-98,MW2019-132
[Invited Talk] Current Status and Perspectives of GaN HEMT Power Amplifiers for 5G Base Stations

Kazutaka Inoue(SEI),  

[Date]2020-01-31
[Paper #]ED2019-96,MW2019-130
Analysis of Self-heating Effect of GaN HEMTs with Buffer Traps by Low Frequency S-parameters Measurements and TCAD Simulation

Tomohiro Otsuka(Mitsubishi Electric),  Yutaro Yamaguchi(Mitsubishi Electric),  Shintaro Shinjo(Mitsubishi Electric),  Toshiyuki Oishi(Saga Univ.),  

[Date]2020-01-31
[Paper #]ED2019-103,MW2019-137
Operation Principle and Structure of normally-off Floating Gate GaN HEMT with Injection Gate

Nagumo Kenshi(Tohoku Univ.),  Kimoto Daiki(Tohoku Univ.),  Suwa Tomoyuki(Tohoku Univ.),  Teramoto Akinobu(Hiroshima Univ.),  Shirota Riichiro(NCTU),  Tskatani Shinichiro(NCTU),  Kuroda Rihito(Tohoku Univ.),  Sugawa Shigetoshi(Tohoku Univ.),  

[Date]2020-01-31
[Paper #]ED2019-104,MW2019-138